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Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction

Published: 07 March 2005 Publication History

Abstract

Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the construction of parametric interconnect models is often hampered by the rapid increase in computational cost and model complexity. In this paper we present an efficient yet accurate parametric model order reduction algorithm for addressing the variability of IC interconnect performance. The efficiency of the approach lies in a novel combination of low-rank matrix approximation and multi-parameter moment matching. The complexity of the proposed parametric model order reduction is as low as that of a standard Krylov subspace method when applied to a nominal system. Under the projection-based framework, our algorithm also preserves the passivity of the resulting parametric models.

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  • (2014)Zonotope-based nonlinear model order reduction for fast performance bound analysis of analog circuits with multiple-interval-valued parameter variationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616621(1-6)Online publication date: 24-Mar-2014
  • (2013)Parametrized model reduction based on semidefinite programmingAutomatica (Journal of IFAC)10.1016/j.automatica.2013.05.02249:9(2840-2844)Online publication date: 1-Sep-2013
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cover image ACM Conferences
DATE '05: Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
March 2005
630 pages
ISBN:0769522882

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IEEE Computer Society

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Published: 07 March 2005

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  • (2017)Performance and robustness of bio-inspired digital liquid state machinesNeurocomputing10.1016/j.neucom.2016.11.045226:C(145-160)Online publication date: 22-Feb-2017
  • (2014)Zonotope-based nonlinear model order reduction for fast performance bound analysis of analog circuits with multiple-interval-valued parameter variationsProceedings of the conference on Design, Automation & Test in Europe10.5555/2616606.2616621(1-6)Online publication date: 24-Mar-2014
  • (2013)Parametrized model reduction based on semidefinite programmingAutomatica (Journal of IFAC)10.1016/j.automatica.2013.05.02249:9(2840-2844)Online publication date: 1-Sep-2013
  • (2010)HORUS - high-dimensional model order reduction via low moment-matching upgraded samplingProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871036(465-470)Online publication date: 8-Mar-2010
  • (2009)On the efficient reduction of complete EM based parametric modelsProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874903(1172-1177)Online publication date: 20-Apr-2009
  • (2009)ARMS - automatic residue-minimization based sampling for multi-point modeling techniquesProceedings of the 46th Annual Design Automation Conference10.1145/1629911.1630156(951-956)Online publication date: 26-Jul-2009
  • (2009)Performance-oriented parameter dimension reduction of VLSI circuitsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.200248917:1(137-150)Online publication date: 1-Jan-2009
  • (2008)Deep submicron interconnect timing model with quadratic random variable analysisProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403637(1091-1094)Online publication date: 10-Mar-2008
  • (2008)SPAREProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403518(586-591)Online publication date: 10-Mar-2008
  • (2007)Parameterized model order reduction via a two-directional Arnoldi processProceedings of the 2007 IEEE/ACM international conference on Computer-aided design10.5555/1326073.1326253(868-873)Online publication date: 5-Nov-2007
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