Article

An ADC-BiST scheme using sequential code analysis

Authors:

Erdem S. Erdogan,

Sule OzevAuthors Info & Claims

DATE '07: Proceedings of the conference on Design, automation and test in Europe

Pages 713 - 718

Published: 16 April 2007 Publication History

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Abstract

This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysis method is an alternative to histogram based analysis techniques to provide test time improvements, especially when the resources are scarce. In addition to the measurement of DNL and INL, non-monotonic behavior can also be detected with the proposed technique. We present two implementation options based on how much on-chip resources are available. The ramp generator has a high linearity over a full-scale range of 1V and the generated ramp signal is capable of testing 13 --- bit ADCs. The circuit implementation of the ramp generator utilizes a feedback configuration to improve the linearity having an area of 0.017mm² in 0.5μm process.

References

[1]

K. Arabi and B. Kaminska. Oscillation Built-In Self-Test (OBIST) Scheme for Functional and Structural Testing of Analog and MixedSignal Integrated Circuits. In IEEE ITC, pages 786--795, Nov 1997.

Digital Library

Google Scholar

[2]

F. Azaïs, S. Bernard, Y. Bertrand, X. Michel, and M. Renovell. A low-cost adaptive ramp generator for analog BIST applications. In IEEE VTS, pages 266--271, Apr 2001.

Digital Library

Google Scholar

[3]

F. Azaïs, S. Bernard, Y. Bertrand, and M. Renovell. A Low-Cost BIST Architecture for Linear Histogram Testting of ADCs. Springer JET, 17(2):139--147, Apr 2001.

Digital Library

Google Scholar

[4]

F. Azaïs, S. Bernard, Y. Bertrand, and M. Renovell. Implementation of a Linear Histogram BiST for ADCs. In IEEE DATE, 2001.

Crossref

Google Scholar

[5]

S. Bernard, F. Azaïs, Y. Bertrand, and M. Renovell. A High Accuracy Triangle-Wave Signal Generator for On-Chip ADC Testing. In IEEE ETW, pages 89--94, May 2002.

Crossref

Google Scholar

[6]

J. Blair. Histogram Measurement of ADC Nonlinearities Using Sine Waves. IEEE TIM, 43(3):373--383, Jun 1994.

Google Scholar

[7]

R. de Vries, T. Zwemstra, E. Bruls, and P. Regtien. BuiltIn SelfTest Methodology for A/D Converters. In IEEE ED&TC, pages 353--358, Mar 1997.

Digital Library

Google Scholar

[8]

A. Frisch and T. Almy. HABIST: Histogram-Based Analog Built-In Self-Test. In IEEE ITC, page 760767, Nov 1997.

Digital Library

Google Scholar

[9]

Johns and Martin. Analog Integrated Circuit Design. John Wiley and Sons, Canada, 1997.

Google Scholar

[10]

J. Larrabee, F. Irons, and D. Hummels. Using Sine Wave Histograms to Estimate ADC Dynamic Error Functions. IEEE TIM, 47(6): 1448--1456, Dec 1998.

Google Scholar

[11]

A. K. Lu and G. W. Roberts. An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications. In IEEE ITC, pages 650--659, Oct 1994.

Digital Library

Google Scholar

[12]

A. K. Lu, G. W. Roberts, and D. A. Johns. A High-Quality Analog Oscillator Using Oversampling D/A Conversion Techniques. IEEE TCAS-II, 41(7), Jul 1994.

Google Scholar

[13]

B. Provost and E. Sanchez-Sinencio. On-Chip Ramp Generators for Mixed-Signal BIST and ADC Self-Test. IEEE JSSC, 38(2):263--273, Feb 2003.

Crossref

Google Scholar

[14]

M. Renovell, F. Azaïs., S. Bernard, and Y. Bertrand. Hardware Resource Minimization for a Histogram-based ADC BIST. In IEEE VTS, pages 247--252, Apr 2000.

Digital Library

Google Scholar

Cited By

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Huang JChou KLu MHuang XDe Micheli GAl-Hashimi BMueller WMacii E(2010)A robust ADC code hit counting techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871349(1749-1754)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871349
Mullane BMacNamee CO'Brien VFleischmann TLombardi FBhanja SMassoud YBahar R(2009)An on-chip solution for static ADC test and measurementProceedings of the 19th ACM Great Lakes symposium on VLSI10.1145/1531542.1531564(81-86)Online publication date: 10-May-2009
https://dl.acm.org/doi/10.1145/1531542.1531564

An ADC-BiST scheme using sequential code analysis
1. Hardware
  1. Very large scale integration design
    1. Application-specific VLSI designs

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Published In

DATE '07: Proceedings of the conference on Design, automation and test in Europe

April 2007

1741 pages

ISBN:9783981080124

General Chair:
Rudy Lauwereins
IMEC and KULeuven, Belgium
,
Program Chair:
Jan Madsen
DTU, Denmark

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EDA Consortium

San Jose, CA, United States

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Published: 16 April 2007

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SIGDA
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DATE07: Design, Automation and Test in Europe

April 16 - 20, 2007

Nice, France

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Huang JChou KLu MHuang XDe Micheli GAl-Hashimi BMueller WMacii E(2010)A robust ADC code hit counting techniqueProceedings of the Conference on Design, Automation and Test in Europe10.5555/1870926.1871349(1749-1754)Online publication date: 8-Mar-2010
https://dl.acm.org/doi/10.5555/1870926.1871349
Mullane BMacNamee CO'Brien VFleischmann TLombardi FBhanja SMassoud YBahar R(2009)An on-chip solution for static ADC test and measurementProceedings of the 19th ACM Great Lakes symposium on VLSI10.1145/1531542.1531564(81-86)Online publication date: 10-May-2009
https://dl.acm.org/doi/10.1145/1531542.1531564

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A 5-bit 3.2-GS/s flash ADC with a digital offset calibration scheme

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A 5-bit 3.2-GS/s flash ADC with a digital offset calibration scheme

A low-power capacitor switching scheme with low common-mode voltage variation for successive approximation ADC

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