Cited By
View all- Kumar SKaundinya SKundu SChattopadhyay SOklobdzija VPangle BChang NShanbhag NKim C(2010)Customizing pattern set for test power reduction via improved X-identification and reorderingProceedings of the 16th ACM/IEEE international symposium on Low power electronics and design10.1145/1840845.1840881(177-182)Online publication date: 18-Aug-2010