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Pruning-based trace signal selection algorithm

Published: 25 January 2011 Publication History

Abstract

To improve the observability in the post-silicon validation, how to select the limited trace signals effectively for the data acquisition is the focus. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. The experiments indicate that the proposed algorithm can bring higher restoration ratios, and it is more effective compared to existing methods.

References

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K. H. Chang, I. L. Markov, V. Bertacco. "Current Landscape in Design and Verification". Lecture Notes in Electrical Engineering, 10.1007/978-1-4020-9365-4-2, 2008.
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D. D. Josephson. "The Manic Depression of Microprocessor Debug". Proc. IEEE International Test Conference (ITC), pp. 657--663, 2002.
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X. Liu and Q. Xu. "Trace Signal Selection for Visibility Enhancement in Post-Silicon Validation". Proc. DATE, pp. 1338--1343, 2009.
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Q. Xu and X. Liu. "On Signal Tracing in Post-Silicon Validation". Proc. ASP-DAC, pp. 262--267, 2010.
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H. F. Ko, N. Nicolici. "Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation". Proc. DATE'08, 2008.
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H. F. Ko, N. Nicolici. "Algorithms for state restoration and trace-signal selection for data acquisition in silicon debug". IEEE Trans. CAD, vol. 28, no. 2, 2009.
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T. Larrabee. "Test pattern generation using Boolean satisfiability". IEEE Trans. CAD, pp. 4--15, 1992.
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F. Brglez and et al. "Combinational profiles of sequential benchmark circuits". IEEE ISCAS, pp. 1929--1934, 1989.

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  1. Pruning-based trace signal selection algorithm

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        cover image ACM Conferences
        ASPDAC '11: Proceedings of the 16th Asia and South Pacific Design Automation Conference
        January 2011
        841 pages
        ISBN:9781424475162

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        IEEE Press

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        Published: 25 January 2011

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