Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling

Massively repeated structures such as SRAM cells usually require extremely low failure rate. This brings on a challenging issue for Monte Carlo based statistical yield analysis, as huge amount of samples have to be drawn in order to observe one single failure. Fast Monte Carlo methods, e.g. importance sampling methods, are still quite expensive as the anticipated failure rate is very low. In this paper, a new method is proposed to tackle this issue. The key idea is to improve traditional importance sampling method with an efficient online surrogate model. The proposed method improves the performance for both stages in importance sampling, i.e. finding the distorted probability density function, and the distorted sampling. Experimental results show that the proposed method is 1e2X~1e5X faster than the standard Monte Carlo approach and achieves 5X~22X speedup over existing state-of-the-art techniques without sacrificing estimation accuracy.