Cited By
View all- Yang BRožić VMentens NDehaene WVerbauwhede IFanucci LTeich J(2016)TOTALProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2971837(127-132)Online publication date: 14-Mar-2016
Embedded HW/SW platform for on-the-fly testing of true random number generators
Authors: 
Bohan Yang, Vladimir Rožić, Nele Mentens, Wim Dehaene, Ingrid VerbauwhedeAuthors Info & Claims
Bohan Yang, Vladimir Rožić, Nele Mentens, Wim Dehaene, Ingrid VerbauwhedeAuthors Info & ClaimsPages 345 - 350
Abstract
We present a HW/SW platform for on-the-fly detection of failures and weaknesses in entropy sources. By splitting the operations between hardware and software, we achieve sufficient flexibility to control the level of significance of the tests. This approach also enables sharing resources between different tests thereby reducing the area and power. Statistical tests were selected from the NIST test suite. We propose several versions of hardware co-processors for monitoring random bit sequences, ranging from 52 slices (5 tests) to 552 slices (9 tests) on Spartan-6 FPGA. We are the first to provide implementations of the Serial test and the Approximate entropy test for on-the-fly monitoring.
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Index Terms
- Embedded HW/SW platform for on-the-fly testing of true random number generators
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Published: 09 March 2015
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View all- Yang BRožić VMentens NDehaene WVerbauwhede IFanucci LTeich J(2016)TOTALProceedings of the 2016 Conference on Design, Automation & Test in Europe10.5555/2971808.2971837(127-132)Online publication date: 14-Mar-2016
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