research-article

The last line effect

Authors:

Moritz Beller,

Andy Zaidman,

Andrey KarpovAuthors Info & Claims

ICPC '15: Proceedings of the 2015 IEEE 23rd International Conference on Program Comprehension

Pages 240 - 243

Published: 16 May 2015 Publication History

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Abstract

Micro-clones are tiny duplicated pieces of code; they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.

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Cited By

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Islam JMondal MRoy CSchneider KGuéhéneuc YKhomh FSarro F(2019)Comparing bug replication in regular and micro code clonesProceedings of the 27th International Conference on Program Comprehension10.1109/ICPC.2019.00022(81-92)Online publication date: 25-May-2019
https://dl.acm.org/doi/10.1109/ICPC.2019.00022
Strüber DAcre?Oaie VPlöger J(2019)Model clone detection for rule-based model transformation languagesSoftware and Systems Modeling (SoSyM)10.1007/s10270-017-0625-618:2(995-1016)Online publication date: 1-Apr-2019
https://dl.acm.org/doi/10.1007/s10270-017-0625-6
Beller MChaudron MCrnkovic IChechik MHarman M(2018)Toward an empirical theory of feedback-driven developmentProceedings of the 40th International Conference on Software Engineering: Companion Proceeedings10.1145/3183440.3190332(503-505)Online publication date: 27-May-2018
https://dl.acm.org/doi/10.1145/3183440.3190332
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The last line effect

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Micro-clones are tiny duplicated pieces of code; they typically comprise only few statements or lines. In this paper, we study the "Last Line Effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an ...
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ICPC '15: Proceedings of the 2015 IEEE 23rd International Conference on Program Comprehension

Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an ...
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Information

Published In

ICPC '15: Proceedings of the 2015 IEEE 23rd International Conference on Program Comprehension

May 2015

325 pages

General Chair:
Andrea De Lucia
University of Salerno, Italy
,
Program Chairs:
Christian Bird
Microsoft Research
,
Rocco Oliveto
University of Molise, Italy

Publisher

IEEE Press

Publication History

Published: 16 May 2015

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ICSE '15

Sponsor:

ACM
SIGSOFT
IEEE-CS\DATC
TCSE

ICSE '15: 37th International Conference on Software Engineering

May 16 - 24, 2015

Florence, Italy

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ICSE 2025

2025 IEEE/ACM 46th International Conference on Software Engineering

April 26 - May 3, 2025

Ottawa , ON , Canada

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Islam JMondal MRoy CSchneider KGuéhéneuc YKhomh FSarro F(2019)Comparing bug replication in regular and micro code clonesProceedings of the 27th International Conference on Program Comprehension10.1109/ICPC.2019.00022(81-92)Online publication date: 25-May-2019
https://dl.acm.org/doi/10.1109/ICPC.2019.00022
Strüber DAcre?Oaie VPlöger J(2019)Model clone detection for rule-based model transformation languagesSoftware and Systems Modeling (SoSyM)10.1007/s10270-017-0625-618:2(995-1016)Online publication date: 1-Apr-2019
https://dl.acm.org/doi/10.1007/s10270-017-0625-6
Beller MChaudron MCrnkovic IChechik MHarman M(2018)Toward an empirical theory of feedback-driven developmentProceedings of the 40th International Conference on Software Engineering: Companion Proceeedings10.1145/3183440.3190332(503-505)Online publication date: 27-May-2018
https://dl.acm.org/doi/10.1145/3183440.3190332
Strüber DPlöger JAcreźOaie V(2016)Clone Detection for Graph-Based Model Transformation LanguagesProceedings of the 9th International Conference on Theory and Practice of Model Transformations - Volume 976510.1007/978-3-319-42064-6_13(191-206)Online publication date: 4-Jul-2016
https://dl.acm.org/doi/10.1007/978-3-319-42064-6_13

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The last line effect explained

The Last Line Effect

The haloed line effect for hidden line elimination.