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New Techniques for Speeding-Up Fault-Injection Campaigns

Published: 04 March 2002 Publication History

Abstract

Fault-tolerant circuits are currently required in severalmajor application sectors, and a new generation of CADtools is required to automate the insertion and validationof fault-tolerant mechanisms. This paper outlines thecharacteristics of a new fault-injection platform and itsevaluation in a real industrial environment. It also detailstechniques devised and implemented within the platform tospeed-up fault-injection campaigns. Experimental resultsare provided, showing the effects of the differenttechniques, and demonstrating that they are able to reducethe total time required by fault-injection campaigns by atleast one order of magnitude.

Cited By

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  • (2016)Fault injection acceleration by simultaneous injection of non-interacting faultsProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2898023(1-6)Online publication date: 5-Jun-2016
  • (2015)Fault injection acceleration by architectural importance samplingProceedings of the 10th International Conference on Hardware/Software Codesign and System Synthesis10.5555/2830840.2830863(212-219)Online publication date: 4-Oct-2015
  • (2014)Rapid Fault-Space Exploration by Evolutionary PruningProceedings of the 33rd International Conference on Computer Safety, Reliability, and Security - Volume 866610.1007/978-3-319-10506-2_2(17-32)Online publication date: 10-Sep-2014
  • Show More Cited By

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cover image ACM Conferences
DATE '02: Proceedings of the conference on Design, automation and test in Europe
March 2002
1072 pages
ISBN:0769514715

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IEEE Computer Society

United States

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Published: 04 March 2002

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Overall Acceptance Rate 518 of 1,794 submissions, 29%

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Cited By

View all
  • (2016)Fault injection acceleration by simultaneous injection of non-interacting faultsProceedings of the 53rd Annual Design Automation Conference10.1145/2897937.2898023(1-6)Online publication date: 5-Jun-2016
  • (2015)Fault injection acceleration by architectural importance samplingProceedings of the 10th International Conference on Hardware/Software Codesign and System Synthesis10.5555/2830840.2830863(212-219)Online publication date: 4-Oct-2015
  • (2014)Rapid Fault-Space Exploration by Evolutionary PruningProceedings of the 33rd International Conference on Computer Safety, Reliability, and Security - Volume 866610.1007/978-3-319-10506-2_2(17-32)Online publication date: 10-Sep-2014
  • (2011)A method to leverage pre-silicon collateral and analysis for post-silicon testing and validationProceedings of the 48th Design Automation Conference10.1145/2024724.2024857(575-578)Online publication date: 5-Jun-2011
  • (2009)Statistical fault injectionProceedings of the Conference on Design, Automation and Test in Europe10.5555/1874620.1874743(502-506)Online publication date: 20-Apr-2009
  • (2008)Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languagesProceedings of the 18th ACM Great Lakes symposium on VLSI10.1145/1366110.1366181(297-302)Online publication date: 4-May-2008
  • (2007)Early Analysis of Fault-based Attack Effects in Secure CircuitsIEEE Transactions on Computers10.1109/TC.2007.107856:10(1431-1434)Online publication date: 1-Oct-2007
  • (2005)Assembly-Level pre-injection analysis for improving fault injection efficiencyProceedings of the 5th European conference on Dependable Computing10.1007/11408901_19(246-262)Online publication date: 20-Apr-2005
  • (2004)Early SEU Fault Injection in Digital, Analog and Mixed Signal CircuitsProceedings of the conference on Design, automation and test in Europe - Volume 110.5555/968878.968957Online publication date: 16-Feb-2004
  • (2004)A New Approach to the Analysis of Single Event Transients in VLSI CircuitsJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000042515.67579.c120:5(511-521)Online publication date: 1-Oct-2004
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