Paper 2004/018
Corrections of the NIST Statistical Test Suite for Randomness
Song-Ju Kim, Ken Umeno, and Akio Hasegawa
Abstract
It is well known that the NIST statistical test suite was used for the evaluation of AES candidate algorithms. We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong. We give four corrections of mistakes in the test settings. This suggests that re-evaluation of the test results should be needed.
Metadata
- Available format(s)
-
PDF PS
- Publication info
- Published elsewhere. Unknown where it was published
- Keywords
- pseudo-randomnessAES
- Contact author(s)
- songju @ crl go jp
- History
- 2004-01-27: received
- Short URL
- https://ia.cr/2004/018
- License
-
CC BY
BibTeX
@misc{cryptoeprint:2004/018, author = {Song-Ju Kim and Ken Umeno and Akio Hasegawa}, title = {Corrections of the {NIST} Statistical Test Suite for Randomness}, howpublished = {Cryptology {ePrint} Archive, Paper 2004/018}, year = {2004}, url = {https://eprint.iacr.org/2004/018} }