IEICE Trans - Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop

Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop

SinNyoung KIM
Akira TSUCHIYA
Hidetoshi ONODERA

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Vol.E97-A No.3 pp.768-776
Publication Date: 2014/03/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E97.A.768
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category:
Keyword:
radiation-hardened phase-locked loop (RH-PLL), soft error, clock-perturbation model,

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Summary:
This paper presents an analysis of radiation-induced clock-perturbation in phase-locked loop (PLL). Due to a trade-off between cost, performance, and reliability, radiation hardened PLL design need robust strategy. Thus, evaluation of radiation vulnerability is important to choose the robust strategy. The conventional evaluation-method is however based on brute-force analysis — SPICE simulation and experiment. The presented analysis result eliminates the brute-force analysis in evaluation of the radiation vulnerability. A set of equations enables to predict the radiation-induced clock-perturbation at the every sub-circuits. From a demonstration, the most vulnerable nodes have been found, which are validated using a PLL fabricated with 0.18µm CMOS process.

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