Summary: We measure neutron-induced Single Event Upsets (SEUs) and Multiple Cell Upsets (MCUs) on Flip-Flops (FFs) in a 65-nm bulk CMOS process in order to evaluate dependence of MCUs on cell distance and well-contact density using four different shift registers. Measurement results by accelerated tests show that MCU/SEU is up to 23.4% and it is exponentially decreased by the distance between latches on FFs. MCU rates can be drastically reduced by inserting well-contact arrays between FFs. The number of MCUs is reduced from 110 to 1 by inserting well-contact arrays under power and ground rails.
