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Measurement of Electronic Structure and Surface Reconstruction in the Superionic Cu2-xTe
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W. Xia, K. Huang, D. Pei, T. Deng, A. J. Liang, J. Jiang, H. F. Yang, J. Zhang, H. J. Zheng, Y. J. Chen, L. X. Yang, Y. F. Guo, M. X. Wang, Z. K. Liu and Y. L. Chen are not registered as owners of this paper. (why?)