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Studying single-electron traps in newly fabricated Skipper-CCDs for the Oscura experiment using the pocket-pumping technique
Authors:
S. E. Perez,
B. A. Cervantes-Vergara,
J. Estrada,
S. Holland,
D. Rodrigues,
J. Tiffenberg
Abstract:
Understanding and characterizing very low-energy ($\sim$eV) background sources is a must in rare-event searches. Oscura, an experiment aiming to probe electron recoils from sub-GeV dark matter using a 10-kg skipper-CCD detector, has recently fabricated its first two batches of sensors. In this work, we present the characterization of defects/contaminants identified in the buried-channel region of…
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Understanding and characterizing very low-energy ($\sim$eV) background sources is a must in rare-event searches. Oscura, an experiment aiming to probe electron recoils from sub-GeV dark matter using a 10-kg skipper-CCD detector, has recently fabricated its first two batches of sensors. In this work, we present the characterization of defects/contaminants identified in the buried-channel region of these newly fabricated skipper-CCDs. These defects/contaminants produce deferred charge from trap emission in the images next to particle tracks, which can be spatially resolved due to the sub-electron resolution achieved with these sensors. Using the trap-pumping technique, we measured the energy and cross section associated to these traps in three Oscura prototype sensors from different fabrication batches which underwent different gettering methods during fabrication. Results suggest that the type of defects/contaminants is more closely linked to the fabrication batch rather than to the gettering method used. The exposure-dependent single-electron rate (SER) of one of these sensors was measured $\sim$100~m underground, yielding $(1.8\pm 0.3)\times10^{-3}~e^-$/pix/day at 131K. The impact of the identified traps on the measured exposure-dependent SER is evaluated via a Monte Carlo simulation. Results suggest that the exposure-dependent SER of Oscura prototype sensors would be lower in lower background environments as expected.
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Submitted 26 June, 2024;
originally announced June 2024.
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SENSEI: First Direct-Detection Results on sub-GeV Dark Matter from SENSEI at SNOLAB
Authors:
SENSEI Collaboration,
Prakruth Adari,
Itay M. Bloch,
Ana M. Botti,
Mariano Cababie,
Gustavo Cancelo,
Brenda A. Cervantes-Vergara,
Michael Crisler,
Miguel Daal,
Ansh Desai,
Alex Drlica-Wagner,
Rouven Essig,
Juan Estrada,
Erez Etzion,
Guillermo Fernandez Moroni,
Stephen E. Holland,
Yonatan Kehat,
Yaron Korn,
Ian Lawson,
Steffon Luoma,
Aviv Orly,
Santiago E. Perez,
Dario Rodrigues,
Nathan A. Saffold,
Silvia Scorza
, et al. (12 additional authors not shown)
Abstract:
We present the first results from a dark matter search using six Skipper-CCDs in the SENSEI detector operating at SNOLAB. With an exposure of 534.9 gram-days from well-performing sensors, we select events containing 2 to 10 electron-hole pairs. After aggressively masking images to remove backgrounds, we observe 55 two-electron events, 4 three-electron events, and no events containing 4 to 10 elect…
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We present the first results from a dark matter search using six Skipper-CCDs in the SENSEI detector operating at SNOLAB. With an exposure of 534.9 gram-days from well-performing sensors, we select events containing 2 to 10 electron-hole pairs. After aggressively masking images to remove backgrounds, we observe 55 two-electron events, 4 three-electron events, and no events containing 4 to 10 electrons. The two-electron events are consistent with pileup from one-electron events. Among the 4 three-electron events, 2 appear in pixels that are likely impacted by detector defects, although not strongly enough to trigger our "hot-pixel" mask. We use these data to set world-leading constraints on sub-GeV dark matter interacting with electrons and nuclei.
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Submitted 20 December, 2023;
originally announced December 2023.
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Confirmation of the spectral excess in DAMIC at SNOLAB with skipper CCDs
Authors:
A. Aguilar-Arevalo,
I. Arnquist,
N. Avalos,
L. Barak,
D. Baxter,
X. Bertou,
I. M. Bloch,
A. M. Botti,
M. Cababie,
G. Cancelo,
N. Castelló-Mor,
B. A. Cervantes-Vergara,
A. E. Chavarria,
J. Cortabitarte-Gutiérrez,
M. Crisler,
J. Cuevas-Zepeda,
A. Dastgheibi-Fard,
C. De Dominicis,
O. Deligny,
A. Drlica-Wagner,
J. Duarte-Campderros,
J. C. D'Olivo,
R. Essig,
E. Estrada,
J. Estrada
, et al. (47 additional authors not shown)
Abstract:
We present results from a 3.25 kg-day target exposure of two silicon charge-coupled devices (CCDs), each with 24 megapixels and skipper readout, deployed in the DAMIC setup at SNOLAB. With a reduction in pixel readout noise of a factor of 10 relative to the previous detector, we investigate the excess population of low-energy events in the CCD bulk previously observed above expected backgrounds. W…
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We present results from a 3.25 kg-day target exposure of two silicon charge-coupled devices (CCDs), each with 24 megapixels and skipper readout, deployed in the DAMIC setup at SNOLAB. With a reduction in pixel readout noise of a factor of 10 relative to the previous detector, we investigate the excess population of low-energy events in the CCD bulk previously observed above expected backgrounds. We address the dominant systematic uncertainty of the previous analysis through a depth fiducialization designed to reject surface backgrounds on the CCDs. The measured bulk ionization spectrum confirms the presence of an excess population of low-energy events in the CCD target with characteristic rate of ${\sim}7$ events per kg-day and electron-equivalent energies of ${\sim}80~$eV, whose origin remains unknown.
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Submitted 26 March, 2024; v1 submitted 2 June, 2023;
originally announced June 2023.
