Showing 1–5 of 5 results for author: Foden, A

Quantitative precipitate classification and grain boundary property control in Co/Ni-base superalloys

Authors: Thomas P McAuliffe, Ioannis Bantounas, Lucy R Reynolds, Alex Foden, Mark Hardy, T Ben Britton, David Dye

Abstract: A correlative approach is employed to simultaneously assess structure and chemistry of (carbide and boride) precipitates in a set of novel Co/Ni-base superalloys. Structure is derived from electron backscatter diffraction (EBSD) with pattern template matching, and chemistry obtained with energy dispersive X-ray spectroscopy (EDS). It is found that the principal carbide in these alloys is Mo and W… ▽ More A correlative approach is employed to simultaneously assess structure and chemistry of (carbide and boride) precipitates in a set of novel Co/Ni-base superalloys. Structure is derived from electron backscatter diffraction (EBSD) with pattern template matching, and chemistry obtained with energy dispersive X-ray spectroscopy (EDS). It is found that the principal carbide in these alloys is Mo and W rich with the M6C structure. An M2B boride, also exhibiting Mo and W segregation is observed at B levels above approximately 0.085 at.%. These phases are challenging to distinguish in an SEM with chemical information (EDS or backscatter Z-contrast) alone, without the structural information provided by EBSD. Only correlative chemical and structural fingerprinting is necessary and sufficient to fully define a phase. The identified phases are dissimilar to those predicted using ThermoCalc. We additionally perform an assessment of the grain boundary serratability in these alloys, and observe that significant amplitude is only obtained in the absence of pinning intergranular precipitates. △ Less

Submitted 2 September, 2020; originally announced September 2020.

Advances in electron backscatter diffraction

Authors: Alex Foden, Alessandro Previero, Thomas Benjamin Britton

Abstract: We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include use of AstroEBSD for single pixel based EBSD mapping and conventional orientation mapping; followed by an unsupervised machine learning approach using principal… ▽ More We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include use of AstroEBSD for single pixel based EBSD mapping and conventional orientation mapping; followed by an unsupervised machine learning approach using principal component analysis and multivariate statistics combined with a refined template matching method to rapidly index orientation data with high precision. Next, we compare a diffraction pattern captured using direct electron detector with a dynamical simulation and project this to create a high quality experimental "reference diffraction sphere". Finally, we classify phases using supervised machine learning with transfer learning and a convolutional neural network. △ Less

Submitted 12 August, 2019; originally announced August 2019.

Comments: Conference paper for "40th Risoe International Symposium: Metal Microstructures in 2D, 3D and 4D"

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope

Authors: T. P. McAuliffe, A. Foden, C. Bilsland, D. Daskalaki-Mountanou, D. Dye, T. B. Britton

Abstract: The routine and unique determination of minor phases in microstructures is critical to materials science. In metallurgy alone, applications include alloy and process development and the understanding of degradation in service. We develop a correlative method, exploring superalloy microstructures which are examined in the scanning electron microscope (SEM) using simultaneous energy dispersive X-ray… ▽ More The routine and unique determination of minor phases in microstructures is critical to materials science. In metallurgy alone, applications include alloy and process development and the understanding of degradation in service. We develop a correlative method, exploring superalloy microstructures which are examined in the scanning electron microscope (SEM) using simultaneous energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). This is performed at an appropriate length scale for characterisation of carbide phases' shape, size, location, and distribution. EDS and EBSD data are generated using two different physical processes, but each provide a signature of the material interacting with the incoming electron beam. Recent advances in post-processing, driven by "big data" approaches, include use of principal component analysis (PCA). Components are subsequently characterised to assign labels to a mapped region. To provide physically meaningful signals, the principal components may be rotated to control the distribution of variance. In this work, we develop this method further through a weighted PCA approach. We use the EDS and EBSD signals concurrently, thereby labelling each region using both EDS (chemistry) and EBSD (crystal structure) information. This provides a new method of amplifying signal-to-noise for very small phases in mapped regions, especially where the EDS or EBSD signal is not unique enough alone for classification. △ Less

Submitted 14 January, 2020; v1 submitted 12 August, 2019; originally announced August 2019.

Comments: As resubmitted after one round of peer review

Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach

Authors: Alexander Foden, David Collins, Angus Wilkinson, Thomas Benjamin Britton

Abstract: Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the crystals on the material surface. The conventional analysis method uses signal processing based on a Hough/Radon transform to index each diffraction pattern. This… ▽ More Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the crystals on the material surface. The conventional analysis method uses signal processing based on a Hough/Radon transform to index each diffraction pattern. This method is limited to the analysis of simple geometric features and ignores subtle characteristics of diffraction patterns, such as variations in relative band intensities. A second method, developed to address the shortcomings of the Hough/Radon transform, is based on template matching of a test experimental pattern with a large library of potential patterns. In the present work, the template matching approach has been refined with a new cross correlation function that allows for a smaller library and enables a dramatic speed up in pattern indexing. Refinement of the indexed orientation is performed with a follow-up step to allow for small alterations to the best match from the library search. The orientation is further refined with rapid measurement of misorientation using whole pattern matching. The refined template matching approach is shown to be comparable in accuracy, precision and sensitivity to the Hough based method, even exceeding it in some cases, via the use of simulations and experimental data collected from a silicon single crystal and a deformed α-iron sample. The drastic speed up and pattern refinement approaches should increase the widespread utility of pattern matching approaches. △ Less

Submitted 9 July, 2019; v1 submitted 30 July, 2018; originally announced July 2018.

Comments: Article resubmitted for peer review, changes highlighted in red

AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach

Authors: Thomas Benjamin Britton, Vivian Tong, Jim Hickey, Alex Foden, Angus Wilkinson

Abstract: Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventionally performed with raw electron backscatter patterns (EBSPs). These patterns are software processed to locate the band centres (and sometimes edges) fr… ▽ More Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventionally performed with raw electron backscatter patterns (EBSPs). These patterns are software processed to locate the band centres (and sometimes edges) from which the crystallographic index of each band is determined. Once a consistent index for many bands are obtained, the crystal orientation with respect to a reference sample & detector orientation can be determined and presented. Unfortunately, due to challenges related to crystal symmetry, there are limited available pattern indexing approaches and this has likely hampered open development of the technique. In this manuscript, we present a new method of pattern indexing, based upon a method with which satellites locate themselves in the night sky, and systematically demonstrate its effectiveness using dynamical simulations and real experimental patterns. The benefit of releasing this new algorithm is demonstrated as we utilise this indexing process, together with dynamical solutions, to provide some of the first accuracy assessments of an indexing solution. In disclosing a new indexing algorithm, and software processing tool-kit, we hope this opens up EBSD developments to more users. The software code and example data is released alongside this article for 3rd party developments. △ Less

Submitted 17 July, 2018; v1 submitted 7 April, 2018; originally announced April 2018.

Comments: This is the accepted version of the article, after review comments have been incorporated (shown in red)