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Showing 1–2 of 2 results for author: Whang, E

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  1. arXiv:2206.08928  [pdf, other

    eess.IV

    Ring Deconvolution Microscopy: An Exact Solution for Spatially-Varying Aberration Correction

    Authors: Amit Kohli, Anastasios N. Angelopoulos, David McAllister, Esther Whang, Sixian You, Kyrollos Yanny, Federico M. Gasparoli, Laura Waller

    Abstract: The most ubiquitous form of computational aberration correction for microscopy is deconvolution. However, deconvolution relies on the assumption that the point spread function is the same across the entire field-of-view. It is well recognized that this assumption is often inadequate, but space-variant deblurring techniques generally require impractical amounts of calibration and computation. We pr… ▽ More

    Submitted 14 March, 2024; v1 submitted 17 June, 2022; originally announced June 2022.

    Comments: 24 pages, 9 figures

  2. arXiv:2004.03264  [pdf, other

    cs.LG cs.CV eess.IV stat.ML

    Inspector Gadget: A Data Programming-based Labeling System for Industrial Images

    Authors: Geon Heo, Yuji Roh, Seonghyeon Hwang, Dayun Lee, Steven Euijong Whang

    Abstract: As machine learning for images becomes democratized in the Software 2.0 era, one of the serious bottlenecks is securing enough labeled data for training. This problem is especially critical in a manufacturing setting where smart factories rely on machine learning for product quality control by analyzing industrial images. Such images are typically large and may only need to be partially analyzed w… ▽ More

    Submitted 21 August, 2020; v1 submitted 7 April, 2020; originally announced April 2020.

    Comments: 10 pages, 11 figures

    Report number: pp 28--36

    Journal ref: Proceedings of the VLDB Endowment, Volume 14, Issue 1, September 2020