ABSTRACT Two-source thermal evaporation technique was used to prepare HgxCd1-xTe thin films onto ... more ABSTRACT Two-source thermal evaporation technique was used to prepare HgxCd1-xTe thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500-2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05< x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p-type and exhibited a resistivity, which varied between 102 and 10-1 Ω-cm.
ABSTRACT Two-source thermal evaporation technique was used to prepare HgxCd1-xTe thin films onto ... more ABSTRACT Two-source thermal evaporation technique was used to prepare HgxCd1-xTe thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500-2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05< x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p-type and exhibited a resistivity, which varied between 102 and 10-1 Ω-cm.
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