15,478 research outputs found
Magnetic sensitive scanning probe microscopy
Get PDFMagnetically sensitive scanning probe microscopes have been solving scientific and engineering problems over the last two decades. The magnetic dipole fields generated by a spherical magnetic particle with radius a decay with math. As the magnetic features of interest become smaller and smaller, the sensitivity of the apparatus has to be improved dramatically in order to measure and image the magnetic features within the specimen. An overview of these powerful methods is given in this article
Scanning probe microscopy imaging of metallic nanocontacts
Full text linkWe show scanning probe microscopy measurements of metallic nanocontacts
between controlled electromigration cycles. The nanowires used for the thinning
process are fabricated by shadow evaporation. The highest resolution obtained
using scanning force microscopy is about 3 nm. During the first few
electromigration cycles the overall slit structure of the nanocontact is
formed. The slit first passes along grain boundaries and then at a later stage
vertically splits grains in the course of consuming them. We find that first
the whole wire is heated and later during the thinning process as the slit
forms the current runs over several smaller contacts which needs less power.Comment: 4 pages, 4 figure
Signatures of spin-charge separation in scanning probe microscopy
Full text linkWe analyze the effect of an auxiliary scatterer, such as the potential of a
scanning tip, on the conductance of an interacting one-dimensional electron
system. We find that the differential conductance for tunneling into the end of
a semi-infinite quantum wire reflects the separation of the elementary
excitations into spin and charge modes. The separation is revealed as a
specific pattern in the dependence of the conductance on bias and on the
position of the scatterer.Comment: 4 pages, 1 figure; published versio
Antiferromagnetic MnNi tips for spin-polarized scanning probe microscopy
Full text linkSpin-polarized scanning tunneling microscopy (SP-STM) measures tunnel
magnetoresistance (TMR) with atomic resolution. While various methods for
achieving SP probes have been developed, each is limited with respect to
fabrication, performance, and allowed operating conditions. In this study, we
present the fabrication and use of SP-STM tips made from commercially available
antiferromagnetic foil. The tips are intrinsically SP,
which is attractive for exploring magnetic phenomena in the zero field limit.
The tip material is relatively ductile and straightforward to etch. We
benchmark the conventional STM and spectroscopic performance of our tips and
demonstrate their spin sensitivity by measuring the two-state switching of
holmium single atom magnets on MgO/Ag(100)
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