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ORCID1. A-MOST 2005: St. Louis, Missouri, USA
- Proceedings of the ICSE 2005 Workshop on Advances in Model-Based Software Testing, A-MOST 2005, St. Louis, Missouri, USA. ACM 2005, ISBN 1-59593-115-5
- Renée C. Bryce, Charles J. Colbourn:
Test prioritization for pairwise interaction coverage. - Xia Cai, Michael R. Lyu:
The effect of code coverage on fault detection under different testing profiles. - Kirk Sayre:
Usage model-based automated testing of C++ templates. - David McGuinness, Liam Murphy
:
A simulation model of a multi-server EJB system. - Albert Schilling, Kelma Madeira, Paula Donegan, Kênia Soares Sousa, Elizabeth Furtado, Vasco Furtado:
An integrated method for designing user interfaces based on tests. - Christopher M. Lott, Ashish Jain, Siddhartha R. Dalal:
Modeling requirements for combinatorial software testing. - Christopher Robinson-Mallett, Peter Liggesmeyer, Tilo Mücke, Ursula Goltz:
Generating optimal distinguishing sequences with a model checker. - Mark Sherriff, Nachiappan Nagappan, Laurie A. Williams, Mladen A. Vouk:
Early estimation of defect density using an in-process Haskell metrics model. - Alan F. Karr, Adam A. Porter:
Distributed performance testing using statistical modeling. - Xing Li, Ramesh Nagarajan:
Modeling for image processing system validation, verification and testing. - Mikhail Auguston, James Bret Michael, Man-tak Shing:
Environment behavior models for scenario generation and testing automation. - Amit M. Paradkar:
Case studies on fault detection effectiveness of model based test generation techniques. - Peter B. Lakey:
Model-based specification and testing applied to the Ground-Based Midcourse Defense (GMD) system: an industry report. - Robert V. Binder, James E. Hanlon:
The advanced mobile application testing environment. 1 - Erika Mir Olimpiew, Hassan Gomaa:
Model-based testing for applications derived from software product lines. - Fabrice Bouquet, Eddie Jaffuel, Bruno Legeard, Fabien Peureux, Mark Utting:
Requirements traceability in automated test generation: application to smart card software validation. - Markus Clermont, David Lorge Parnas:
Using information about functions in selecting test cases.
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