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ORCIDVTS 1997: Monterey, California, USA
VTS 1997: Monterey, California, USA
- 15th IEEE VLSI Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, USA. IEEE Computer Society 1997, ISBN 0-8186-7810-0
Core & Processor Test
- Kaushik De:
Test methodology for embedded cores which protects intellectual property. 2-9 - Nur A. Touba, Bahram Pouya:
Testing Embedded Cores Using Partial Isolation Rings. 10-16 - Kazumi Hatayama, Kazunori Hikone, Takeshi Miyazaki, Hiromichi Yamada:
A practical approach to instruction-based test generation for functional modules of VLSI processors. 17-23
RAM Test
- V. Kim, T. Chen:
Assessing SRAM test coverage for sub-micron CMOS technologies. 24-30 - Hiroyuki Goto, Shigeo Nakamura, Kazuhiko Iwasaki:
Experimental fault analysis of 1 Mb SRAM chips. 31-36 - Ad J. van de Goor, Issam B. S. Tlili:
Disturb Neighborhood Pattern Sensitive Fault. 37-47
BIST I
- Albrecht P. Stroele, Frank Mayer:
Methods to reduce test application time for accumulator-based self-test. 48-53 - Franco Fummi, Donatella Sciuto:
Implicit test pattern generation constrained to cellular automata embedding. 54-59 - Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda
:
Cellular automata for deterministic sequential test pattern generation. 60-67
Current Testing Techniques
- Rosa Rodríguez-Montañés, Joan Figueras:
Bridges in sequential CMOS circuits: current-voltage signatur. 68-73 - Yiming Gong, Sreejit Chakravarty:
Using fault sampling to compute IDDQ diagnostic test set. 74-79 - Claude Thibeault:
A novel probabilistic approach for IC diagnosis based on differential quiescent current signatures. 80-87
Delay Test & Diagnosis
- Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer:
High Quality Robust Tests for Path Delay Faults. 88-93 - Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch:
An optimized BIST test pattern generator for delay testing. 94-100 - Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi:
On the Fault Coverage of Interconnect Diagnosis. 101-109
Fault Modeling & Parametric Test
- Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer:
Analysis of Ground Bounce in Deep Sub-Micron Circuits. 110-116 - Peter Dahlgren:
Switch-level modeling of feedback faults using global oscillation control. 117-122 - T. Haulin:
Built-in parametric test for controlled impedance I/Os. 123-129
Verification & Debugging
- Peter Wohl, John A. Waicukauski:
Using ATPG for clock rules checking in complex scan design. 130-136 - Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham:
A Novel Solution for Chip-Level Functional Timing Verification. 137-142 - Shi-Yu Huang, Kuang-Chien Chen, Kwang-Ting Cheng:
Incremental logic rectification. 143-149 - Martin Keim, Michael Martin, Bernd Becker, Rolf Drechsler, Paul Molitor:
Polynomial Formal Verification of Multipliers. 150-157
Analog Test 1
- Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska:
CLP-based Multifrequency Test Generation for Analog Circuits. 158-165 - Karim Arabi, Bozena Kaminska:
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. 166-171 - Zbigniew Jaworski, Mariusz Niewczas, Wieslaw Kuzmicz:
Extension of Inductive Fault Analysis to Parametric Faults in Analog Circuits with Application to Test Generation. 172-176 - Nihal J. Godambe, Chuanjin Richard Shi:
Behavioral level noise modeling and jitter simulation of phase-locked loops with faults using VHDL-AMS. 177-183
Panel Session
- J. Borel, M. Cecchini, C. Malipeddi, Janusz Rajski, Yervant Zorian:
Systems On Silicon: Design and Test Challenges. 184-185 - Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater:
Will 0.1um Digital Circuits Require Mixed-Signal Testing. 186-187
Sequential Circuits Test 1
- Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. 188-195 - Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs:
Diagnostic Test Pattern Generation for Sequential Circuits. 196-202 - Ajay Khoche, Erik Brunvand:
Critical hazard free test generation for asynchronous circuits. 203-209
Concurrent Checking
- Cecilia Metra, Michele Favalli, Bruno Riccò:
Highly testable and compact single output comparator. 210-215 - Xrysovalantis Kavousianos, Dimitris Nikolos:
Self-exercising self testing k-order comparators. 216-221 - Valery A. Vardanian:
Exact probabilistic analysis of error detection for parity checkers. 222-229
Test of Regular Structures
- Michel Renovell, Joan Figueras, Yervant Zorian:
Test of RAM-based FPGA: methodology and application to the interconnect. 230-237 - Dimitris Gizopoulos, Mihalis Psarakis, Antonis M. Paschalis:
Robust Sequential Fault Testing of Iterative Logic Arrays. 238-244 - C. A. Fleischer, Lee A. Belfore II:
A new approach for testing artificial neural networks. 245-251
Analog Test II
- Christian Dufaza, Hassan Ihs:
Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits. 252-260 - Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. 261-266 - Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen:
Functional test pattern generation for CMOS operational amplifier. 267-273
Fault Simulation and Redundancy Identification
- Dilip Krishnaswamy, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee:
SPITFIRE: scalable parallel algorithms for test set partitioned fault simulation. 274-281 - Laura Farinetti, Pier Luca Montessoro:
The Dynamic Rollback Problem in Concurrent Event-Driven Fault Simulation. 282-287 - Jian-Kun Zhao, Elizabeth M. Rudnick, Janak H. Patel:
Static logic implication with application to redundancy identification. 288-295
Mixed Signal Test
- Wim Verhaegen, Geert Van der Plas, Georges G. E. Gielen:
Automated test pattern generation for analog integrated circuits. 296-301 - Eduardo J. Peralías, Adoración Rueda, José L. Huertas:
A DFT Technique for Analog-to-Digital Converters with digital correction. 302-307 - W. D. Bartlett:
Determination of coherence errors in ADC spectral domain testing. 308
Panel Session
- Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. 459 - D. Cheung, Bernd Koenemann, S. Nishtala, B. West, D. Wu:
ATE for VLSI: What Challenges Lie Ahead? 318-319 - J. Abraham, Phyllis G. Frankl, Christian Landrault, Meryem Marzouki, Paolo Prinetto, Chantal Robach, Pascale Thévenod-Fosse:
Hardware Test: Can We Learn from Software Testing? 320-321
Sequential Circuits Test II
- Priyank Kalla, Maciej J. Ciesielski:
Testability of Sequential Circuits with Multi-Cycle False Path. 322-328 - Irith Pomeranz, Sudhakar M. Reddy:
EXTEST: a method to extend test sequences of synchronous sequential circuits to increase the fault coverage. 329-335 - Irith Pomeranz, Sudhakar M. Reddy:
On n-detection test sequences for synchronous sequential circuits343. 336-343
On-Line Testing and Fault-Tolerant Design
- J. Yeandel, D. Thulborn, Simon Jones:
An on-line testable UART implemented using IFIS. 344-349 - Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR. 350-355 - Giacomo Buonanno, M. Pugassi, Mariagiovanna Sami:
A high-level synthesis approach to design of fault-tolerant systems. 356-363
Scan and Boundary Scan
- Samy Makar, Edward J. McCluskey:
ATPG for scan chain latches and flip-flops. 364-369 - Robert B. Norwood, Edward J. McCluskey:
High-Level Synthesis for Orthogonal Sca. 370-375 - Chen-Huan Chiang, Sandeep K. Gupta:
BIST TPGs for Faults in Board Level Interconnect via Boundary Scan. 376-383
Testability Analysis
- Alvin Jee, F. Joel Ferguson:
A methodolgy for characterizing cell testability. 384-390 - V. Prepin, R. David:
Fault coverage of a long random test sequence estimated from a short simulation. 391-398 - Jacob Savir:
Random pattern testability of memory control logic. 399-409
BIST II
- Nur A. Touba:
Obtaining High Fault Coverage with Circular BIST Via State Skipping. 410-415 - Jacob Savir:
Salvaging test windows in BIST diagnostic. 416-425 - Can Ökmen, Martin Keim, Rolf Krieger, Bernd Becker:
On Optimizing BIST-Architecture by Using OBDD-based Approaches and Genetic Algorithms. 426-433
Thermal & Elevated Voltage Testing
- Josep Altet, Antonio Rubio:
Differential Sensing Strategy for Dynamic Thermal Testing of ICs. 434-439 - Vladimír Székely, Márta Rencz, Bernard Courtois:
Integrating on-chip temperature sensors into DfT schemes and BIST architectures. 440-445 - Jonathan T.-Y. Chang, Edward J. McCluskey:
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. 446-
Panel Session
- Vishwani D. Agrawal, Robert C. Aitken, J. Braden, Joan Figueras, S. Kumar, Hans-Joachim Wunderlich, Yervant Zorian:
Power Dissipation During Testing: Should We Worry About it? 456-457 - Magdy S. Abadir, Jacob A. Abraham, Hong Hao, C. Hunter, Wayne M. Needham, Ron G. Walther:
Microprocessor Test and Validation: Any New Avenues? 458-464
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