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ORCIDGordon W. Roberts
Gordon Walter Roberts
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- affiliation: McGill University, Montreal, Canada
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2020 – today
- 2024
[j43]Saad Yousaf
, Gordon W. Roberts:
Applying Nyquist's Stability Analysis to Bode Plots With Wrapped Phase Behavior. IEEE Trans. Circuits Syst. II Express Briefs 71(3): 1062-1066 (2024)- [c117]Mahmood A. Mohammed, Ahmed S. Emara, Gordon W. Roberts:
Slew-Rate Analysis of Scalable Multi-Stage CMOS Operational Transconductance Amplifiers. MWSCAS 2024: 15-19 - 2023
- [j42]Mahmood A. Mohammed, Gordon W. Roberts:
Scalable Multi-Stage CMOS OTAs With a Wide CL-Drivability Range Using Low-Frequency Zeros. IEEE Trans. Circuits Syst. I Regul. Pap. 70(1): 74-87 (2023) - [j41]Rafid Adnan Khan, Saad Yousaf, Gordon W. Roberts:
An In-Circuit Test Method for Measuring the Bonding Resistances of Individual IC Pins From an Interconnected Multiple IC Assembly of Flexible Hybrid Electronics. IEEE Trans. Circuits Syst. II Express Briefs 70(3): 939-943 (2023) - [c116]Muhammad Bilal Babar, Gordon W. Roberts:
An Area Efficient and Inductorless Implementation of Continuous-Time Linear Equalization Scheme for High Speed and Low Noise TIA Designs. ISCAS 2023: 1-5 - 2022
- [j40]Gordon Walter Roberts:
Identifying A(s) and β(s) in Single-Loop Feedback Circuits Using the Intermediate Transfer Function Approach. Sensors 22(11): 4303 (2022) - [c115]Muhammad Bilal Babar, Gordon W. Roberts, Reza Maram:
A 83-GHz and 68-dBΩ TIA with 2.3 pA/√ Hz: Towards High Speed and Low Noise Optical Receivers. NEWCAS 2022: 361-365 - 2021
- [j39]Rafid Adnan Khan, Mohammad Muhtady Muhaisin, Gordon W. Roberts:
Extracting RLC Parasitics From a Flexible Electronic Hybrid Assembly Using On-Chip ESD Protection Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 68(10): 4025-4037 (2021) - [j38]Mahmood A. Mohammed, Gordon W. Roberts:
Generalized Relationship Between Frequency Response and Settling Time of CMOS OTAs: Toward Many-Stage Design. IEEE Trans. Circuits Syst. I Regul. Pap. 68(12): 4993-5006 (2021) - [j37]Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Soheyl Ziabakhsh, Mahdi Parvizi, Naim Ben-Hamida:
An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications. IEEE Trans. Very Large Scale Integr. Syst. 29(11): 1861-1874 (2021) - [c114]Mahmood A. Mohammed, Gordon W. Roberts:
Conventional CMOS OTAs Driving nF-Range Capacitive Loads. ISCAS 2021: 1-5 - [c113]Mahmood A. Mohammed, Gordon W. Roberts:
A Scalable Many-Stage CMOS OTA for Closed-Loop Applications. ISCAS 2021: 1-5 - [c112]Gordon W. Roberts:
Single-Loop Feedback Parameter Extraction Method for Stability Analysis of Electronic Circuits. ISCAS 2021: 1-4 - [c111]Gordon W. Roberts:
A Modified Nyquist Stability Criteria that Takes into Account Input/Output Circuit Loading Effects. NEWCAS 2021: 1-4 - 2020
- [j36]Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Optimized Periodic ΣΔ Bitstreams for DC Signal Generation Used in Dynamic Calibration Applications. IEEE Open J. Circuits Syst. 1: 3-12 (2020) - [c110]Rafid Adnan Khan, Mohammad Muhtady Muhaisin, Gordon W. Roberts:
An In-Situ Technique for Measuring the Individual Contact Resistance between the Pins of an IC Package and the Board of a Flexible Hybrid Electronic System. ISCAS 2020: 1-5 - [c109]Mahmood A. Mohammed, Gordon W. Roberts:
The Impact of the Scaled-Down CMOS Technologies on the Step Response Degradation Caused by the Pole-Zero Doublets in the OTAs. LASCAS 2020: 1-4 - [c108]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters. NEWCAS 2020: 299-302
2010 – 2019
- 2019
- [j35]Soheil Ziabakhsh, Ghyslain Gagnon, Gordon W. Roberts:
A Second-Order Bandpass $\Delta\Sigma$ Time-to-Digital Converter With Negative Time-Mode Feedback. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(4): 1355-1368 (2019) - [c107]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
On the Design of DACs for Dynamic Calibration Applications using Periodic Sequences from ΣΔ Modulators. CCECE 2019: 1-4 - [c106]Mahmood A. Mohammed, Gordon W. Roberts:
Investigating the Developments on the Frequency Compensation Techniques of the Two-Stage OTAs - A Brief Guide and Updated Review -. ICM 2019: 219-222 - [c105]Mohammad Muhtady Muhaisin, Rafid Adnan Khan, Jonathan Telfort, Wolfgang Heger, Gordon W. Roberts:
Opportunities and Challenges in Desktop-Inkjet Based Flexible Hybrid Electronics. MWSCAS 2019: 746-749 - [c104]Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
Selecting the Fastest Settling-Time Filter in PDM-based DACs used for Dynamic Calibration Applications. MWSCAS 2019: 900-903 - 2018
- [j34]Yan Li, Gordon W. Roberts:
Design of High-Order Type-II Delay-Locked Loops With a Fast-Settling-Zero-Overshoot Step Response and Large Jitter-Rejection Capabilities. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(6): 1805-1818 (2018) - [j33]Soheil Ziabakhsh, Ghyslain Gagnon, Gordon W. Roberts:
The Peak-SNR Performances of Voltage-Mode versus Time-Mode Circuits. IEEE Trans. Circuits Syst. II Express Briefs 65-II(12): 1869-1873 (2018) - [j32]Moataz Abdelfattah, Gordon W. Roberts:
Cascade and LC Ladder-Based Filter Realizations Using Synchronous Time-Mode Signal Processing. IEEE Trans. Very Large Scale Integr. Syst. 26(9): 1788-1801 (2018) - [c103]Soheil Ziabakhsh, Ghyslain Gagnon, Gordon W. Roberts:
An All-Digital High-Resolution Programmable Time-Difference Amplifier Based on Time Latch. ISCAS 2018: 1-5 - [c102]Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
A coherent subsampling test system arrangement suitable for phase domain measurements. VTS 2018: 1-6 - 2017
- [j31]Moataz Abdelfattah, Gordon W. Roberts:
All-Digital Time-Mode Direct-Form All-Pole Biquadratic Filter Realization. IEEE Trans. Circuits Syst. II Express Briefs 64-II(11): 1262-1266 (2017) - [c101]Ghyslain Gagnon, François Gagnon, Gordon W. Roberts:
The analytic expression of the output spectrum of ΔΣ ADCs with nonlinear binary-weighted DACs and Gaussian input signals. ISCAS 2017: 1-4 - [c100]Christian Fayomi, Hervé Achigui Facpong, Judith Müller, Gordon W. Roberts:
Passive sensors for flexible hybrid-printed electronics' systems: An IC designer view. MWSCAS 2017: 807-810 - [c99]Soheil Ziabakhsh, Ghyslain Gagnon, Gordon W. Roberts:
A time-mode LDI-based resonator for a band-pass ΔΣ TDC. MWSCAS 2017: 1296-1299 - 2016
- [j30]Yan Li, Steven Bielby, Azhar A. Chowdhury, Gordon W. Roberts:
A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O. J. Electron. Test. 32(4): 423-436 (2016) - [j29]Ming Yang, Gordon W. Roberts:
Synthesis of High Gain Operational Transconductance Amplifiers for Closed-Loop Operation Using a Generalized Controller-Based Compensation Method. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(11): 1794-1806 (2016) - [j28]Omar Abdelfattah, George Gal, Gordon W. Roberts, Ishiang Shih, Yi-Chi Shih:
A Top-Down Design Methodology Encompassing Components Variations Due to Wide-Range Operation in Frequency Synthesizer PLLs. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2050-2061 (2016) - [c98]Adam Gordon, Gordon W. Roberts, Christian Jesús B. Fayomi:
Low-cost trimmable manufacturing methods for printable electronics. ISCAS 2016: 870-873 - [c97]Yan Li, Gordon W. Roberts:
Design of high-order type-II delay-locked loops using a Gaussian transfer function approach. ISCAS 2016: 1786-1789 - [c96]Gordon W. Roberts:
Mixed-signal ATE technology and its impact on today's electronic system. ITC 2016: 1-7 - [c95]Moataz Abdelfattah, Gordon W. Roberts:
Experimental operation of time-mode building blocks using a time-mode switched-delay unit. MWSCAS 2016: 1-4 - [c94]Aly M. Shoukry, Gordon W. Roberts:
Top-down design and synthesis of inherently-stable integrator-based high-order amplifiers. NEWCAS 2016: 1-4 - [c93]Ming Yang, Gordon W. Roberts:
A digitally programmable 50-150dB DC gain operational transconductance amplifier in 130nm CMOS. NEWCAS 2016: 1-4 - 2015
- [j27]Rubin A. Parekhji, Kenneth Butler, Gordon W. Roberts:
Guest Editors' Introduction: Speeding Up Analog Integration and Test for Mixed-Signal SoCs. IEEE Des. Test 32(1): 6-8 (2015) - [j26]Omar Abdelfattah, Gordon W. Roberts, Ishiang Shih, Yi-Chi Shih:
An Ultra-Low-Voltage CMOS Process-Insensitive Self-Biased OTA With Rail-to-Rail Input Range. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(10): 2380-2390 (2015) - [c92]Gordon W. Roberts:
Quick and easy CMOS amplifier design and optimization. ECCTD 2015: 1-4 - [c91]Steven Bielby, Gordon W. Roberts:
An embedded probabilistic extraction unit for on-chip jitter measurements. ISCAS 2015: 113-116 - [c90]Omar Abdelfattah, Gordon W. Roberts, Ishiang Shih, Yi-Chi Shih:
A 0.35-V bulk-driven self-biased OTA with rail-to-rail input range in 65 nm CMOS. ISCAS 2015: 257-260 - [c89]Soheil Ziabakhsh, Ghyslain Gagnon, Gordon W. Roberts:
Wide linear range voltage-controlled delay unit for time-mode signal processing. ISCAS 2015: 1826-1829 - [c88]Omar Abdelfattah, Ishiang Shih, Gordon W. Roberts, Yi-Chi Shih:
A 0.55-V 1-GHz frequency synthesizer PLL for ultra-low-voltage ultra-low-power applications. LASCAS 2015: 1-4 - [c87]Omar Abdelfattah, Ishiang Shih, Gordon W. Roberts, Yi-Chi Shih:
A 0.6V-supply bandgap reference in 65 nm CMOS. NEWCAS 2015: 1-4 - 2014
- [c86]Omar Abdelfattah, Ishiang Shih, Gordon W. Roberts, Yi-Chi Shih:
Optimization of LC-VCO tuning range under different inductor/varactor losses limitations. CCECE 2014: 1-5 - [c85]Steven Bielby, Gordon W. Roberts:
Sub-gate-delay edge-control of a clock signal using DLLs and ΣΔ modulation techniques. CCECE 2014: 1-5 - [c84]Mike Li, Gordon W. Roberts:
Testability and reliability enhancement techniques. CICC 2014: 1 - [c83]Shudong Lin, Gordon W. Roberts:
Towards a general purpose mixed-signal instrumentation layer in the die stack of a 3D-SIC. ETS 2014: 1-2 - [c82]Gordon W. Roberts:
Reducing the analog-digital productivity gap using time-mode signal processing. ISCAS 2014: 782-785 - [c81]Moataz Abdelfattah, Gordon W. Roberts, Vamsy P. Chodavarapu:
All-digital Time-Mode elliptic filters based on the operational simulation of LC ladders. ISCAS 2014: 2125-2128 - 2013
- [c80]Omar Abdelfattah, Ishiang Shih, Gordon W. Roberts:
A simple analog CMOS design tool using transistor dimension-independent parameters. ISCAS 2013: 1067-1070 - [c79]Gordon W. Roberts, Rob Aitken:
Welcome message. ITC 2013: 1 - [c78]Omar Abdelfattah, Ishiang Shih, Gordon W. Roberts:
Analytical comparison between passive loop filter topologies for frequency synthesizer PLLs. NEWCAS 2013: 1-4 - [c77]Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas:
Special session 12B: Panel post-silicon validation & test in huge variance era. VTS 2013: 1 - 2012
- [j25]Tsung-Yen Tsai, Sadok Aouini, Gordon W. Roberts:
High Speed On-Chip Signal Generation for Debug and Diagnosis. J. Electron. Test. 28(5): 625-640 (2012) - [j24]Sadok Aouini, Kun Chuai, Gordon W. Roberts:
Anti-Imaging Time-Mode Filter Design Using a PLL Structure With Transfer Function DFT. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(1): 66-79 (2012) - [j23]Mohammed Ali-Bakhshian, Gordon W. Roberts:
A Digital Implementation of a Dual-Path Time-to-Time Integrator. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(11): 2578-2591 (2012) - [c76]Azhar A. Chowdhury, Gordon W. Roberts:
A probabilistic test instrument using a ΣΔ-encoded amplitude/phase-signal generation technique. ISCAS 2012: 2501-2504 - [c75]Marco Macedo, Gordon W. Roberts, Ishiang Shih:
Track and hold for Giga-sample ADC applications using CMOS technology. ISCAS 2012: 2725-2728 - [c74]George Gal, Omar Abdelfattah, Gordon W. Roberts:
A 30-40 GHz fractional-N frequency synthesizer development using a Verilog-A high-level design methodology. MWSCAS 2012: 57-60 - 2011
- [c73]Tsung-Yen Tsai, Gordon W. Roberts:
Programmable phase/frequency generator for system debug and diagnosis using the IEEE 1149.1 test bus. CICC 2011: 1-4 - [c72]Ali Ameri, Gordon W. Roberts:
Time-mode reconstruction iir filters for ΣΔ phase modulation applications. ACM Great Lakes Symposium on VLSI 2011: 423-426 - 2010
- [j22]Gordon W. Roberts, Mohammed Ali-Bakhshian:
A Brief Introduction to Time-to-Digital and Digital-to-Time Converters. IEEE Trans. Circuits Syst. II Express Briefs 57-II(3): 153-157 (2010) - [c71]Sadok Aouini, Kun Chuai, Gordon W. Roberts:
Jitter generation and capture using phase-domain sigma-delta encoding. APCCAS 2010: 52-55 - [c70]Sadok Aouini, Kun Chuai, Gordon W. Roberts:
A low-cost ATE phase signal generation technique for test applications. ITC 2010: 29-38
2000 – 2009
- 2009
- [j21]Gordon W. Roberts, Sadok Aouini:
Mixed-Signal Production Test: A Measurement Principle Perspective. IEEE Des. Test Comput. 26(5): 48-62 (2009) - [j20]Christopher S. Taillefer, Gordon W. Roberts:
Delta-Sigma A/D Conversion Via Time-Mode Signal Processing. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(9): 1908-1920 (2009) - [c69]Mike Li, Gordon W. Roberts:
Test methods and ICs for high-speed serdes. CICC 2009 - [c68]Mohammed Ali-Bakhshian, Gordon W. Roberts:
A Semi-digital Interface for Capacitive Sensors. ISCAS 2009: 1957-1960 - [c67]Michael M. Guttman, Gordon W. Roberts:
Sampled-data IIR Filtering using Time-mode Signal Processing Circuits. ISCAS 2009: 2285-2288 - [c66]Euisoo Yoo, Gordon W. Roberts:
Optimizing CMOS Amplifier Design Directly in SPICE without the Need for Additional Mathematical Models. ISCAS 2009: 2497-2500 - [e1]Gordon W. Roberts, Bill Eklow:
2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. IEEE Computer Society 2009, ISBN 978-1-4244-4868-5 [contents] - 2008
- [j19]Mona Safi-Harb, Gordon W. Roberts:
Embedded Measurement of GHz Digital Signals With Time Amplification in CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 55-I(7): 1884-1896 (2008) - [c65]Mike Li, Gordon W. Roberts:
Session 4 - High-speed test, characterization, and debug. CICC 2008 - [c64]Dong An, Gordon W. Roberts:
A metastability-independent time-to-voltage converter. ISCAS 2008: 2298-2301 - [c63]Sadok Aouini, Gordon W. Roberts:
Generating Test Signals for Noise-Based NPR/ACPR Type Tests in Production. ITC 2008: 1-9 - [c62]Gordon W. Roberts:
Test Methods For Sigma-Delta Data Converters and Related Devices. SBCCI 2008: 3 - [c61]Gordon W. Roberts, Mohammed Ali-Bakhshian:
Time-domain analog signal processing techniques. SBCCI 2008: 7 - 2007
- [j18]Mona Safi-Harb, Gordon W. Roberts:
70-GHz Effective Sampling Time-Base On-Chip Oscilloscope in CMOS. IEEE J. Solid State Circuits 42(8): 1743-1757 (2007) - [c60]Christopher S. Taillefer, Gordon W. Roberts:
Delta-Sigma Analog-to-Digital Conversion via Time-Mode Signal Processing. ISCAS 2007: 13-16 - 2006
- [j17]Christian Jesús B. Fayomi, Mohamad Sawan, Gordon W. Roberts:
Low-Voltage Analog Switch in Deep Submicron CMOS: Design Technique and Experimental Measurements. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 89-A(4): 1076-1087 (2006) - [c59]Mona Safi-Harb, Gordon W. Roberts:
A 70-GHz Effective Sampling Rate On-Chip Oscilloscope with Time-Domain Digitization. CICC 2006: 61-64 - [c58]Mona Safi-Harb, Gordon W. Roberts:
A CMOS circuit for embedded GHz measurement of digital signal rise time degradation. ISCAS 2006 - [c57]Christopher S. Taillefer, Gordon W. Roberts:
Process-insensitive modulated-clock voltage comparator. ISCAS 2006 - [c56]Sadok Aouini, Gordon W. Roberts:
A Predictable Robust Fully Programmable Analog Gaussian Noise Source for Mixed-Signal/Digital ATE. ITC 2006: 1-10 - 2005
- [j16]David R. Rolston, David M. Gross, Gordon W. Roberts, David V. Plant:
A Distributed Synchronized Clocking Method. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(8): 1597-1607 (2005) - [j15]Mona Safi-Harb, Gordon W. Roberts:
Low power delta-sigma Modulator for ADSL applications in a low-Voltage CMOS technology. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(10): 2075-2089 (2005) - [j14]Christopher S. Taillefer, Gordon W. Roberts:
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment Without Increasing Test Time. IEEE Trans. Very Large Scale Integr. Syst. 13(7): 852-860 (2005) - [c55]Gordon W. Roberts, Robert C. Aitken:
Noise and reliability containment approaches. CICC 2005: 20-21 - [c54]Christian Jesús B. Fayomi, Gordon W. Roberts, Mohamad Sawan:
Low-voltage CMOS analog bootstrapped switch for sample-and-hold circuit: design and chip characterization. ISCAS (3) 2005: 2200-2203 - 2004
- [j13]Antonio H. Chan, Gordon W. Roberts:
A jitter characterization system using a component-invariant Vernier delay line. IEEE Trans. Very Large Scale Integr. Syst. 12(1): 79-95 (2004) - [c53]Peter M. Levine, Gordon W. Roberts:
A calibration technique for a high-resolution flash time-to-digital converter. ISCAS (1) 2004: 253-256 - [c52]Mourad Oulmane, Gordon W. Roberts:
A CMOS time amplifier for Femto-second resolution timing measurement. ISCAS (1) 2004: 509-512 - [c51]Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sébastien Laberge, Gordon W. Roberts:
A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. ITC 2004: 728-737 - [c50]Christopher S. Taillefer, Gordon W. Roberts:
Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time. ITC 2004: 953-962 - [c49]Peter M. Levine, Gordon W. Roberts:
A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme. ITC 2004: 1148-1157 - 2003
- [j12]Robert C. Aitken, Gordon W. Roberts:
ITC 2003: Breaking Test Interface Bottlenecks. IEEE Des. Test Comput. 20(5): 54- (2003) - [j11]Gordon W. Roberts, Robert C. Aitken:
ITC Highlights. IEEE Des. Test Comput. 20(5): 55-57 (2003) - [j10]Mohamed M. Hafed, Gordon W. Roberts:
Techniques for high-frequency integrated test and measurement. IEEE Trans. Instrum. Meas. 52(6): 1780-1786 (2003) - [c48]Mohamed M. Hafed, Gordon W. Roberts:
A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles. CICC 2003: 621-624 - [c47]Mohamed M. Hafed, Gordon W. Roberts:
An 8-channel, 12-bit, 20 MHz fully differential tester IC for analog and mixed-signal circuits. ESSCIRC 2003: 193-196 - [c46]Clarence K. L. Tam, Gordon W. Roberts:
A DC current measurement circuit for on-chip applications. ISCAS (1) 2003: 101-104 - 2002
- [j9]Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts:
A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits. IEEE J. Solid State Circuits 37(4): 499-514 (2002) - [c45]Antonio H. Chan, Gordon W. Roberts:
A deep sub-micron timing measurement circuit using a single-stage Vernier delay line. CICC 2002: 77-80 - [c44]Bardia Pishdad, Gordon W. Roberts:
A 10-bit 1 MS/s 3-step ADC with bitstream-based sub-DAC and sub-ADC calibration. ISCAS (1) 2002: 501-504 - [c43]Sébastien Laberge, Gordon W. Roberts:
Temperature compensated CMOS voltage reference. ISCAS (1) 2002: 717-720 - [c42]Mohamed M. Hafed, Gordon W. Roberts:
Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores. ITC 2002: 1022-1030 - [c41]Gordon W. Roberts:
Mixed-Signal BIST: Fact or Fiction. ITC 2002: 1204 - 2001
- [c40]Nazmy Abaskharoun, Gordon W. Roberts:
Circuits for on-chip sub-nanosecond signal capture and characterization. CICC 2001: 251-254 - [c39]Geoffrey D. Duerden, Gordon W. Roberts, M. Jamal Deen:
The development of bipolar log domain filters in a standard CMOS process. ISCAS (1) 2001: 145-148 - [c38]Arshan Aga, Gordon W. Roberts:
A CMOS digitally programmable current steering semidigital FIR reconstruction filter. ISCAS (1) 2001: 168-171 - [c37]Nazmy Abaskharoun, Mohamed M. Hafed, Gordon W. Roberts:
Strategies for on-chip sub-nanosecond signal capture and timing measurements. ISCAS (4) 2001: 174-177 - [c36]Naveen Chandra, Gordon W. Roberts:
Top-down analog design methodology using Matlab and Simulink. ISCAS (5) 2001: 319-322 - [c35]Christian Jesús B. Fayomi, Gordon W. Roberts, Mohamad Sawan:
A 1-V, 10-bit rail-to-rail successive approximation analog-to-digital converter in standard 0.18 um CMOS technology. ISCAS (1) 2001: 460-463 - [c34]Christian Jesús B. Fayomi, Mohamad Sawan, Gordon W. Roberts:
A design strategy for a 1-V rail-to-rail input/output CMOS opamp. ISCAS (1) 2001: 639-642 - [c33]Clarence K. L. Tam, Gordon W. Roberts:
A robust DC current generation and measurement technique for deep submicron circuits. ISCAS (1) 2001: 719-722 - [c32]Antonio H. Chan, Gordon W. Roberts:
A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. ITC 2001: 858-867 - [c31]Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements. ITC 2001: 1190-1199 - [c30]Henry Chang, Steve Dollens, Gordon W. Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham:
Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them? VTS 2001: 415-416 - 2000
- [j8]Benoit Dufort, Gordon W. Roberts:
Increasing the performance of arbitrary waveform generators using periodic sigma-delta modulated streams. IEEE Trans. Instrum. Meas. 49(1): 188-199 (2000) - [c29]Mohamed M. Hafed, Gordon W. Roberts:
A stand-alone integrated excitation/extraction system for analog BIST applications. CICC 2000: 83-86 - [c28]Mohamed M. Hafed, Sébastien Laberge, Gordon W. Roberts:
A robust deep submicron programmable DC voltage generator. ISCAS 2000: 5-8 - [c27]Christian Jesús B. Fayomi, Gordon W. Roberts, Mohamad Sawan:
Low power/low voltage high speed CMOS differential track and latch comparator with rail-to-rail input. ISCAS 2000: 653-656 - [c26]Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements. ITC 2000: 1031-1040
1990 – 1999
- 1999
- [j7]Gordon W. Roberts, Benoit Dufort:
Making complex mixed-signal telecommunication integrated circuits testable. IEEE Commun. Mag. 37(6): 90-96 (1999) - [j6]Benoit Dufort, Gordon W. Roberts:
On-chip analog signal generation for mixed-signal built-in self-test. IEEE J. Solid State Circuits 34(3): 318-330 (1999) - [j5]Loai Louis, John Abcarius, Gordon W. Roberts:
An eighth-order bandpass ΔΣ modulator for A/D conversion in digital radio. IEEE J. Solid State Circuits 34(4): 423-431 (1999) - [c25]Mourad N. El-Gamal, Gordon W. Roberts:
A 1.2 V NPN-only log-domain integrator. ISCAS (2) 1999: 681-684 - 1998
- [j4]Benoît R. Veillette, Gordon W. Roberts:
On-chip measurement of the jitter transfer function of charge-pump phase-locked loops. IEEE J. Solid State Circuits 33(3): 483-491 (1998) - [j3]Evan M. Hawrysh, Gordon W. Roberts:
An integration of memory-based analog signal generation into current DFT architectures. IEEE Trans. Instrum. Meas. 47(3): 748-759 (1998) - [c24]Benoit Dufort, Gordon W. Roberts:
On-chip analog signal generator for mixed-signal built-in self-test. CICC 1998: 549-552 - [c23]Benoit Dufort, Gordon W. Roberts:
Increasing the performance of arbitrary waveform generators using sigma-delta coding techniques. ITC 1998: 241-248 - [c22]Ara Hajjar, Gordon W. Roberts:
A high speed and area efficient on-chip analog waveform extractor. ITC 1998: 688-697 - [c21]Benoît R. Veillette, Gordon W. Roberts:
Stimulus generation for built-in self-test of charge-pump phase-locked loops. ITC 1998: 698-707 - 1997
- [j2]Benoît R. Veillette, Gordon W. Roberts:
Delta-sigma oscillators: versatile building blocks. Int. J. Circuit Theory Appl. 25(5): 407-418 (1997) - [j1]Robert Wodnicki, Gordon W. Roberts, Martin D. Levine:
A log-polar image sensor fabricated in a standard 1.2-μm ASIC CMOS process. IEEE J. Solid State Circuits 32(8): 1274-1277 (1997) - [c20]Benoit Dufort, Gordon W. Roberts:
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams. ITC 1997: 396-405 - [c19]Benoît R. Veillette, Gordon W. Roberts:
On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. ITC 1997: 776-785 - 1996
- [c18]Gordon W. Roberts:
Metrics, techniques and recent developments in mixed-signal testing. ICCAD 1996: 514-521 - [c17]Evan M. Hawrysh, Gordon W. Roberts:
An Integration of Memory-Based Analog Signal Generation into Current DFT Architectures. ITC 1996: 528-537 - 1995
- [c16]D. Perry, Gordon W. Roberts:
Log-Domain Filters Based on LC Ladder Synthesis. ISCAS 1995: 311-314 - [c15]Benoît R. Veillette, Gordon W. Roberts:
Bandpass Signal Generation Using Delta-Sigma Modulation Techniques. ISCAS 1995: 637-640 - [c14]Gordon W. Roberts:
Calculating Distortion Levels in Sampled-Data Circuits Using SPICE. ISCAS 1995: 2059-2062 - [c13]Xavier Haurie, Gordon W. Roberts:
Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing. ITC 1995: 78-86 - [c12]Gordon W. Roberts:
Re-examining the Needs of the Mixed-Signal Test. ITC 1995: 298 - [c11]Benoît R. Veillette, Gordon W. Roberts:
A Bulti-in Self-Test Strategy for Wireless Communication Systems. ITC 1995: 930-939 - 1994
- [c10]Morie E. Malowany, Gordon W. Roberts, Vinod K. Agarwal:
VAMP: A Hierarchical Framework for Design for Manufacturability. ISCAS 1994: 141-144 - [c9]Peter M. Sinn, Gordon W. Roberts:
A Comparison of First and Second Generation Switched-Current Cells. ISCAS 1994: 301-304 - [c8]A. K. Lu, Gordon W. Roberts:
An Analog Multi-Tone Signal Generator for Built-In Self-Test Applications. ITC 1994: 650-659 - [c7]Michael F. Toner, Gordon W. Roberts:
A BIST technique for a frequency response and intermodulation distortion test of a sigma-delta ADC. VTS 1994: 60-65 - 1993
- [c6]I. Song, Gordon W. Roberts:
A 5th Order Bilinear Switched-current Chebyshev Filter. ISCAS 1993: 1097-1100 - [c5]P. J. Crawley, Gordon W. Roberts:
Predicting Harmonic Distortion in Switched-current Memory Circuits. ISCAS 1993: 1243-1250 - [c4]A. K. Lu, Gordon W. Roberts, David A. Johns:
A High-Quality Analog Oscillator Using Oversampling D/A Conversion Techniques. ISCAS 1993: 1298-1301 - [c3]P. J. Crawley, Gordon W. Roberts:
Designing Operational Transconductance Amplifiers for Low Voltage Operation. ISCAS 1993: 1455-1458 - [c2]Michael F. Toner, Gordon W. Roberts:
Towards Built-In-Self-Test for SNR Testing of a Mixed-Signal IC. ISCAS 1993: 1599-1602 - [c1]Michael F. Toner, Gordon W. Roberts:
A BIST Scheme for an SNR Test of a Sigma-Delta ADC. ITC 1993: 805-814
Coauthor Index
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