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ORCIDElie Maricau
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2010 – 2019
- 2013
[c15]Georges G. E. Gielen, Elie Maricau:
Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS. DATE 2013: 326-331- 2012
- [c14]Georges G. E. Gielen
, Elie Maricau, Pieter De Wit:
Designing reliable analog circuits in an unreliable world. CICC 2012: 1-4 - [c13]Elie Maricau, Dimitri de Jonghe, Georges G. E. Gielen:
Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection. DATE 2012: 745-750 - [c12]Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos:
Advances in variation-aware modeling, verification, and testing of analog ICs. DATE 2012: 1615-1620 - [c11]Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen:
Offset measurement method for accurate characterization of BTI-induced degradation in opamps. ICECS 2012: 661-664 - 2011
- [j3]Elie Maricau, Georges G. E. Gielen:
Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(1): 50-58 (2011) - [c10]Elie Maricau, Georges G. E. Gielen:
Stochastic circuit reliability analysis. DATE 2011: 1285-1290 - [c9]Georges G. E. Gielen, Elie Maricau, Pieter De Wit:
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. DATE 2011: 1474-1479 - [c8]Elie Maricau, Georges G. E. Gielen:
Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines. ESSCIRC 2011: 243-246 - [c7]Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen:
Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. ICECS 2011: 161-164 - 2010
- [j2]Elie Maricau, Georges G. E. Gielen:
Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 1884-1893 (2010) - [c6]Elie Maricau, Georges G. E. Gielen:
Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity. DATE 2010: 1094-1099 - [c5]Georges G. E. Gielen, Elie Maricau, Pieter De Wit:
Design automation towards reliable analog integrated circuits. ICCAD 2010: 248-251
2000 – 2009
- 2009
- [c4]Elie Maricau, Georges G. E. Gielen:
Efficient reliability simulation of analog ICs including variability and time-varying stress. DATE 2009: 1238-1241 - [c3]Elie Maricau, Georges G. E. Gielen:
A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS 2009: 21-26 - [c2]Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou:
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS 2009: 129 - 2008
- [j1]Elie Maricau, Pieter De Wit, Georges G. E. Gielen:
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectron. Reliab. 48(8-9): 1576-1580 (2008) - [c1]Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría:
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
Coauthor Index
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