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ORCIDWilfrid Claeys
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2010 – 2019
- 2014
[j16]Josep Altet
, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà:
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014)
2000 – 2009
- 2009
- [j15]Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire:
Joule expansion imaging techniques on microlectronic devices. Microelectron. J. 40(9): 1367-1372 (2009) - 2008
- [j14]Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire:
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48(2): 204-211 (2008) - [c2]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - 2006
- [j13]Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectron. Reliab. 46(9-11): 1520-1524 (2006) - [j12]Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio:
Dynamic Surface Temperature Measurements in ICs. Proc. IEEE 94(8): 1519-1533 (2006) - 2005
- [j11]Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire:
ElectroStatic Discharge Fault Localization by Laser Probing. Microelectron. Reliab. 45(9-11): 1482-1486 (2005) - 2004
- [j10]Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz:
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectron. J. 35(10): 797-803 (2004) - [j9]Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale:
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectron. J. 35(10): 811-816 (2004) - [j8]Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby:
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44(1): 95-103 (2004) - [j7]Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys:
Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Trans. Reliab. 53(2): 293-296 (2004) - 2003
- [j6]Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys:
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectron. Reliab. 43(9-11): 1609-1613 (2003) - [j5]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - 2001
- [j4]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36(1): 81-91 (2001) - [j3]Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys:
Laser diode COFD analysis by thermoreflectance microscopy. Microelectron. Reliab. 41(9-10): 1597-1601 (2001) - 2000
- [c1]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
1990 – 1999
- 1999
- [j2]Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility. J. Electron. Test. 14(1-2): 57-66 (1999) - [j1]Véronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys:
Temperature measurements of metal lines under current stress by high-resolution laser probing. IEEE Trans. Instrum. Meas. 48(1): 69-74 (1999)
Coauthor Index
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