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2020 – today
- 2023
[c10]P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik:
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS 2023: 1-6- 2022
- [c9]M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min:
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS 2022: 5 - [c8]Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam:
Robust Off-State TDDB Reliability of n-LDMOS. IRPS 2022: 26-1 - 2021
- [c7]P. Srinivasan
, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall:
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS 2021: 1-6 - [c6]Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam:
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS 2021: 1-6 - 2020
- [c5]Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey B. Johnson, William Taylor, Myra Boenke, Byoung Min:
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. IRPS 2020: 1-5 - [c4]P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min:
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS 2020: 1-4 - [c3]Stewart E. Rauch, Dongho Lee, Alexey Vert, Lin Jiang, Byoung Min:
Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. OFC 2020: 1-3
2010 – 2019
- 2019
- [c2]M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, Jeffrey B. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam:
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS 2019: 1-6
2000 – 2009
- 2006
- [c1]Héctor Sánchez, Bill Johnstone, Doug Roberts, Om Mandhana, Brad Melnick, Muhsin Celik, Mike Baker, Jim Hayden, Byoung Min, John Edgerton, Bruce White:
Increasing Microprocessor Speed by Massive Application of On-Die High-K MIM Decoupling Capacitors. ISSCC 2006: 2190-2199
Coauthor Index
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