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ORCIDAnthony J. Walton
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2010 – 2019
- 2018
[j7]Damion K. Corrigan
, Vincent Vezza, Holger Schulze, Till T. Bachmann, Andrew R. Mount, Anthony J. Walton, Jonathan G. Terry:
A Microelectrode Array with Reproducible Performance Shows Loss of Consistency Following Functionalization with a Self-Assembled 6-Mercapto-1-hexanol Layer. Sensors 18(6): 1891 (2018)- 2017
- [c11]C. M. Mackenzie Dover, Yifan Li, Sofia Korniliou, K. Sefiane, Jonathan G. Terry, Anthony J. Walton:
Polydimethylsiloxane (PDMS)-based microfluidic channel with integrated commercial pressure sensors. IEEE SENSORS 2017: 1-3 - [c10]Chandrasekaran Gunasekaran, Ian Underwood, Anthony J. Walton, Andrew R. Mount:
CMOS current attenuator for electrochemical sensing applications. IEEE SENSORS 2017: 1-3 - [c9]Hannah J. Levene, Ilka Schmueser, Ewen O. Blair, Jonathan G. Terry, Andrew R. Mount, Anthony J. Walton:
Investigating the durability of electrochemical sensors for molten salts. IEEE SENSORS 2017: 1-3 - 2014
- [j6]Giuseppe Schiavone, Marc P. Y. Desmulliez, Anthony J. Walton:
Integrated Magnetic MEMS Relays: Status of the Technology. Micromachines 5(3): 622-653 (2014) - 2010
- [j5]Mizanur R. Khondoker, Till T. Bachmann, Muriel Mewissen, Paul Dickinson, Bartosz Dobrzelecki, Colin J. Campbell, Andrew R. Mount, Anthony J. Walton, Jason Crain, Holger Schulze, Gerard Giraud, Alan J. Ross, Ilenia Ciani, Stuart W. J. Ember, Chaker Tlili, Jonathan G. Terry, Eilidh Grant, Nicola McDonnell, Peter Ghazal:
Multi-Factorial Analysis of Class Prediction Error: Estimating Optimal Number of Biomarkers for Various Classification Rules. J. Bioinform. Comput. Biol. 8(6): 945-965 (2010)
2000 – 2009
- 2008
- [c8]Nakul Haridas, Ahmet T. Erdogan, Tughrul Arslan, Anthony J. Walton, Stewart Smith, Tom Stevenson, Camelia Dunare, Alan M. Gundlach, Jonathan G. Terry, Petros Argyrakis, Kevin Tierney, Alan J. Ross, Tony O'Hara:
Reconfigurable MEMS Antennas. AHS 2008: 147-154 - [e1]William Redman-White, Anthony J. Walton:
ESSCIRC 2008 - 34th European Solid-State Circuits Conference, Edinburgh, Scotland, UK, 15-19 September 2008. IEEE 2008, ISBN 978-1-4244-2361-3 [contents] - 2006
- [c7]Tughrul Arslan, Nakul Haridas, Erfu Yang, Ahmet T. Erdogan, Nick Barton, Anthony J. Walton, John S. Thompson, Adrian Stoica, Tanya Vladimirova, Klaus D. McDonald-Maier, W. Gareth J. Howells:
ESPACENET: A Framework of Evolvable and Reconfigurable Sensor Networks for Aerospace-Based Monitoring and Diagnostics. AHS 2006: 323-329 - 2004
- [j4]Yongmin Lee, J. Gourlay, W. J. Hossack, Ian Underwood, Anthony J. Walton:
Modelling of binary phase modulation in surface stabilized ferroelectric liquid crystal spatial light modulators. Microelectron. J. 35(2): 193-201 (2004) - 2003
- [j3]Alton B. Horsfall, Joyce M. M. dos Santos, S. M. Soare, Nicholas G. Wright, A. G. O'Neill, Steve J. Bull, Anthony J. Walton, Alan M. Gundlach, J. T. M. Stevenson:
Direct measurement of residual stress in integrated circuit interconnect features. Microelectron. Reliab. 43(9-11): 1797-1801 (2003)
1990 – 1999
- 1999
- [j2]Gerard A. Allan, Anthony J. Walton:
Efficient extra material critical area algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(10): 1480-1486 (1999) - 1997
- [c6]Gerard A. Allan, Anthony J. Walton:
Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28 - 1996
- [c5]Gerard A. Allan, Anthony J. Walton:
Yield Prediction by Sampling with the EYES Tool. DFT 1996: 39-47 - [c4]Thomas G. Waring, Gerard A. Allan, Anthony J. Walton:
Integration of DFM Techniques and Design Automation. DFT 1996: 59-67 - 1995
- [c3]Gerard A. Allan, Anthony J. Walton:
Hierarchical critical area extraction with the EYE tool. DFT 1995: 28-36 - [c2]Gerard A. Allan, Anthony J. Walton:
Critical area extraction of extra material soft faults. DFT 1995: 55-62 - 1994
- [c1]Gerard A. Allan, Anthony J. Walton:
Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96 - 1992
- [j1]Gerard A. Allan, Anthony J. Walton, Robert J. Holwill:
A yield improvement technique for IC layout using local design rules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(11): 1355-1362 (1992)
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