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2020 – today
- 2024
[c39]K. Tahraoui, R. Burelle, T. Vayssade, F. Lefevre, Laurent Latorre, Florence Azaïs:
Digital Generation of RF Phase-Modulated Test Stimuli: Application to BPSK Modulation Scheme. DFT 2024: 1-6- [c38]K. Tahraoui, T. Vayssade, François Lefèvre, Laurent Latorre, Florence Azaïs:
Digital generation of single tone FM/PM test stimuli: a theoretical analysis. LATS 2024: 1-6 - 2023
- [c37]Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS 2023: 1-2 - 2022
- [j12]Jonathan Miquel
, Laurent Latorre, Simon Chamaillé-Jammes:
Addressing Power Issues in Biologging: An Audio/Inertial Recorder Case Study. Sensors 22(21): 8196 (2022) - 2021
- [j11]T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(11): 2400-2410 (2021) - [c36]Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
Digital test of ZigBee transmitters: Validation in industrial test environment. DATE 2021: 396-401 - [c35]Thibault Vayssade, Mouhamad Chehaitly, Florence Azaïs, Laurent Latorre, François Lefèvre:
Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli. ETS 2021: 1-6 - 2020
- [c34]T. Vayssade, Florence Azaïs, Laurent Latorre, François Lefevre:
EVM measurement of RF ZigBee transceivers using standard digital ATE. DFT 2020: 1-6 - [c33]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4
2010 – 2019
- 2019
- [c32]T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition. ETS 2019: 1-6 - 2018
- [c31]T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE. IOLTS 2018: 17-22 - 2017
- [c30]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Combo of innovative educational approaches to teach industrial test to undergraduate students. EDUCON 2017: 56-64 - 2016
- [j10]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. J. Electron. Test. 32(1): 69-82 (2016) - [j9]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. J. Circuits Syst. Comput. 25(3): 1640014:1-1640014:18 (2016) - [c29]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Industrial test project oriented education. EDUCON 2016: 119-124 - [c28]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Per peers learning educational approach to teach industrial test to undergraduate students. EWME 2016: 1-6 - [c27]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Problem-Based Learning Approach to Teach Printed Circuit Boards Test. ICL (1) 2016: 45-57 - 2015
- [j8]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. J. Electron. Test. 31(5-6): 443-459 (2015) - [c26]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. DDECS 2015: 237-242 - [c25]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
A new technique for low-cost phase noise production testing from 1-bit signal acquisition. ETS 2015: 1-6 - [c24]Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre:
A digital technique for the evaluation of SSB phase noise of analog/RF signals. LATS 2015: 1-6 - 2014
- [c23]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Low-cost phase noise testing of complex RF ICs using standard digital ATE. ITC 2014: 1-9 - [c22]Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre:
Phase noise measurement on IF analog signals using standard digital ATE resources. NEWCAS 2014: 121-124 - 2012
- [c21]Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet:
An efficient control variates method for yield estimation of analog circuits based on a local model. ICCAD 2012: 415-421 - [c20]Florence Azaïs, Laurent Latorre:
Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE). NEWCAS 2012: 197-200 - [c19]Souha Hacine, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Study of a high-resolution and low-power CMOS temperature sensor. NEWCAS 2012: 205-208 - 2011
- [j7]Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir:
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electron. Test. 27(3): 289-303 (2011) - 2010
- [c18]Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir:
On the use of standard digital ATE for the analysis of RF signals. ETS 2010: 43-48 - [c17]El Mehdi Boujamaa, Boris Alandry, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A low power interface circuit for resistive sensors with digital offset compensation. ISCAS 2010: 3092-3095 - [c16]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW 2010: 1-7
2000 – 2009
- 2009
- [j6]Laurent Latorre, Beatrice Pradarelli, Pascal Nouet:
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. Int. J. Online Eng. 5(S1): 43-50 (2009) - [j5]Beatrice Pradarelli, Laurent Latorre, Marie-Lise Flottes, Yves Bertrand, Pascal Nouet:
Remote Labs for Industrial IC Testing. IEEE Trans. Learn. Technol. 2(4): 304-311 (2009) - [c15]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium 2009: 261-266 - 2008
- [c14]Jean-Marc Gallière, Philippe Papet, Laurent Latorre:
A 2-D VHDL-AMS Model for Disk-Shape Piezoelectric Transducers. BMAS 2008: 148-152 - [c13]Olivier Leman, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A Closed-Loop Architecture with Digital Output for Convective Accelerometers. ISVLSI 2008: 51-56 - [c12]Boris Alandry, Norbert Dumas, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A CMOS Multi-sensor System for 3D Orientation Determination. ISVLSI 2008: 57-62 - [i2]Olivier Leman, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers. CoRR abs/0805.0920 (2008) - [i1]El Mehdi Boujamaa, Yannick Soulie, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS. CoRR abs/0805.0925 (2008) - 2006
- [j4]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electron. Test. 22(2): 189-198 (2006) - 2005
- [c11]Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet:
Towards on-line testing of MEMS using electro-thermal excitation. ETS 2005: 76-81 - [c10]Laurent Latorre, Yves Bertrand, Michel Robert, Marie-Lise Flottes:
Test Engineering Education in Europe - The CRTC experience through the EuNICE-Test project. EDUTECH 2005: 63-77 - [c9]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS 2005: 213-218 - 2004
- [j3]Laurent Latorre, Vincent Beroulle, Pascal Nouet:
Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(6): 962-967 (2004) - [c8]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
Electrically-induced thermal stimuli for MEMS testing. ETS 2004: 60-65 - 2002
- [j2]M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, Guy Perez, Jean Marc Nicot, Coumar Oudéa:
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectron. Reliab. 42(9-11): 1777-1782 (2002) - [c7]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120 - [c6]Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival:
European Network for Test Education. DELTA 2002: 230-234 - [c5]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. LATW 2002: 99-104 - [c4]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444 - 2001
- [j1]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electron. Test. 17(5): 439-450 (2001) - [c3]Vincent Beroulle, Laurent Latorre, M. Dardalhon, Coumar Oudéa, Guy Perez, Francis Pressecq, Pascal Nouet:
Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251 - [c2]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
1990 – 1999
- 1999
- [c1]Laurent Latorre, Yves Bertrand, P. Hazard, Francis Pressecq, Pascal Nouet:
Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE 1999: 239-243
Coauthor Index
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