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ORCIDFelix Beaudoin
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2000 – 2009
- 2007
[j30]Felix Beaudoin, Kevin Sanchez, Philippe Perdu:
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47(9-11): 1517-1522 (2007)- 2006
- [j29]Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis:
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46(9-11): 1563-1568 (2006) - 2005
- [j28]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j27]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45(9-11): 1465-1470 (2005) - [j26]C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier:
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45(9-11): 1514-1519 (2005) - [j25]Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte:
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45(9-11): 1538-1543 (2005) - [j24]Danick Briand
, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu:
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45(9-11): 1786-1789 (2005) - 2004
- [j23]Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu:
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44(9-11): 1605-1609 (2004) - [j22]Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis:
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44(9-11): 1655-1662 (2004) - [j21]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44(9-11): 1675-1680 (2004) - 2003
- [j20]David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères:
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43(1): 71-79 (2003) - [j19]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j18]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j17]Xavier Lafontan, Francis Pressecq, Felix Beaudoin, Sebastien Rigo, M. Dardalhon, J.-L. Roux, Petra Schmitt, J. Kuchenbecker, B. Baradat, Djemel Lellouchi:
The advent of MEMS in space. Microelectron. Reliab. 43(7): 1061-1083 (2003) - [j16]Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003) - [j15]Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis:
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43(9-11): 1639-1644 (2003) - [j14]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [j13]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - [j12]Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu:
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43(9-11): 1755-1760 (2003) - [j11]Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina:
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43(9-11): 1809-1814 (2003) - [c2]Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah:
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263 - 2002
- [j10]Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps:
Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectron. Reliab. 42(9-11): 1449-1452 (2002) - [j9]Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement:
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42(9-11): 1581-1585 (2002) - [j8]Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002) - [j7]Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002) - [j6]Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats:
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42(9-11): 1815-1817 (2002) - [c1]Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal:
A 2.5 Gbit/s CMOS optical receiver frontend. ISCAS (5) 2002: 441-444 - 2001
- [j5]Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001) - [j4]Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis:
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1477-1482 (2001) - [j3]Romain Desplats, Philippe Perdu, Felix Beaudoin:
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41(9-10): 1495-1499 (2001) - [j2]Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1539-1544 (2001) - [j1]Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis:
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41(9-10): 1557-1561 (2001)
Coauthor Index
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