"A unified approach for off-line and on-line testing of VLSI systems."

Parag K. Lala, S. Yang, Fadi Busaba (1996)

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DOI: 10.1109/DFTVS.1996.572025

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/dft/LalaYB96
Parag K. Lala, S. Yang, Fadi Busaba:
A unified approach for off-line and on-line testing of VLSI systems. DFT 1996: 195-203

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