Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                

"Scalable and efficient analog parametric fault identification."

Mustafa Berke Yelten et al. (2013)

Details and statistics

DOI: 10.1109/ICCAD.2013.6691147

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24