"An Integrated Test Platform for Nanostructure Electrical Characterization."

Olivier Duval et al. (2004)

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DOI: 10.1109/ICMENS.2004.1508953

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Olivier Duval, L.-P. Lafrance, Yvon Savaria, Patrick Desjardins:
An Integrated Test Platform for Nanostructure Electrical Characterization. ICMENS 2004: 237-242

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