"Analysis of pattern-dependent and timing-dependent failures in an ..."

Jonathan T.-Y. Chang et al. (1998)

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DOI: 10.1109/TEST.1998.743151

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/ChangTLPM98
Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey:
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193

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