"An Experimental Study on Latch Up Failure of CMOS LSI."

Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto (2008)

> Home

Details and statistics

DOI: 10.1109/SSIRI.2008.28

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ssiri/KohinataAF08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ssiri/KohinataAF08
Hideo Kohinata, Masayuki Arai, Satoshi Fukumoto:
An Experimental Study on Latch Up Failure of CMOS LSI. SSIRI 2008: 215-216

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.