"Detection of CMOS Defects under Variable Processing Conditions."

Amy Germida, James F. Plusquellic (2000)

> Home

Details and statistics

DOI: 10.1109/VTEST.2000.843846

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vts/GermidaP00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/GermidaP00
Amy Germida, James F. Plusquellic:
Detection of CMOS Defects under Variable Processing Conditions. VTS 2000: 195-204

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.