"Identifying Untestable Faults in Sequential Circuits."

Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen (1995)

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DOI: 10.1109/MDT.1995.466367

access: closed

type: Journal Article

metadata version: 2023-03-07

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Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Identifying Untestable Faults in Sequential Circuits. IEEE Des. Test Comput. 12(3): 14-23 (1995)

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