"Embedded Deterministic Test for Low-Cost Manufacturing."

Janusz Rajski et al. (2003)

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DOI: 10.1109/MDT.2003.1232257

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/RajskiKMTTQ03
Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian:
Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Des. Test Comput. 20(5): 58-66 (2003)

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