"Simultaneous learning of reduced prototypes and local metric for image set ..."

Zhenwen Ren et al. (2019)

> Home

Details and statistics

DOI: 10.1016/J.ESWA.2019.05.025

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eswa/RenWSW19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eswa/RenWSW19
Zhenwen Ren, Bin Wu, Quansen Sun, Mingna Wu:
Simultaneous learning of reduced prototypes and local metric for image set classification. Expert Syst. Appl. 134: 102-111 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.