"Connectivity Test for System in Package Interconnects."

JungHo Kang, Kyungsoo Chae, Jaeyoun Jeong (2019)

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DOI: 10.1007/S10836-019-05810-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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JungHo Kang, Kyungsoo Chae, Jaeyoun Jeong:
Connectivity Test for System in Package Interconnects. J. Electron. Test. 35(4): 559-565 (2019)

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