"Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low ..."

Jee-Youl Ryu, Bruce C. Kim (2005)

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DOI: 10.1016/J.MEJO.2005.01.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jee-Youl Ryu, Bruce C. Kim:
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectron. J. 36(8): 770-777 (2005)

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