"Algorithm-Driven Advances for Scientific CT Instruments: From model-based ..."

S. V. Venkatakrishnan et al. (2022)

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DOI: 10.1109/MSP.2021.3123594

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type: Journal Article

metadata version: 2022-01-08

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S. V. Venkatakrishnan, K. Aditya Mohan, Amirkoushyar Ziabari, Charles A. Bouman:
Algorithm-Driven Advances for Scientific CT Instruments: From model-based to deep learning-based approaches. IEEE Signal Process. Mag. 39(1): 32-43 (2022)

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