"Finding failures from passed test cases: improving the pattern ..."

W. K. Chan, Jeffrey C. F. Ho, T. H. Tse (2010)

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DOI: 10.1002/STVR.408

access: closed

type: Journal Article

metadata version: 2021-04-09

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W. K. Chan, Jeffrey C. F. Ho, T. H. Tse:
Finding failures from passed test cases: improving the pattern classification approach to the testing of mesh simplification programs. Softw. Test. Verification Reliab. 20(2): 89-120 (2010)

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