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"Data-Driven Optimal Test Selection Design for Fault Detection and ..."

Yang Li et al. (2022)

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DOI: 10.1109/TIM.2022.3168930

access: closed

type: Journal Article

metadata version: 2022-05-18

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Yang Li, Hongtian Chen, Ningyun Lu, Bin Jiang, Enrico Zio:
Data-Driven Optimal Test Selection Design for Fault Detection and Isolation Based on CCVKL Method and PSO. IEEE Trans. Instrum. Meas. 71: 1-10 (2022)

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