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29th NATW 2020: Albany, NY, USA
- 29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020. IEEE 2020, ISBN 978-1-7281-9699-2
- Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome:
Passive Intermodulation (PIM) Test and Measurement. 1-3 - Naznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala
:
AI Powered THz VLSI Testing Technology. 1-5 - Konstantinos Poulos, Themistoklis Haniotakis:
A Built In Test circuit for waveform classification at high frequencies. 1-5 - Marcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson:
Verification and Testing Considerations of an In-Memory AI Chip. 1-6 - Stewart E. Rauch
, Dongho Lee, Alexey Vert, Roy Gupta:
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. 1-4 - Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch
, B. Min:
Self-heating characterization and its applications in technology development. 1-7 - Joshua Immanuel, Spencer K. Millican:
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. 1-6
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