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2020 – today
- 2022
[c7]Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel:
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. IRPS 2022: 59-1- 2021
- [c6]Zhixing Zhao, Steffen Lehmann, Wei Lun Oo, Amit Kumar Sahoo, Shafi Syed, Quang Huy Le, Dang Khoa Huynh, Talha Chohan, Dirk Utess, Dominik Kleimaier, Maciej Wiatr, Sabine Kolodinski, Jerome Mazurier, Jan Hoentschel, Andreas Knorr, Ned Cahoon, Stefan Kneitz:
22FDSOI device towards RF and mmWave applications. BCICTS 2021: 1-6 - [c5]Luca Pirro, Aarthi Jayakumar, Olaf Zimmerhackl, Dieter Lipp, Ralf Illgen, Armin Muehlhoff, Ronny Pfuetzner, Alban Zaka, Michael Otto, Jan Hoentschel, Yannick Raffel, Konrad Seidel, Ricardo Olivo:
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices. IRPS 2021: 1-4
2010 – 2019
- 2019
- [c4]Zhixing Zhao, Patrick James Artz, Klaus Hempel, Juergen Faul, Tianbing Chen, Richard Taylor, Jerome Mazurier, Carsten Grass, Jan Hoentschel, David Harame, Steffen Lehmann, Luca Lucci, Yogadissen Andee, Alexis Divay, Luca Pirro, Tom Herrmann, Alban Zaka, Ricardo Sousa
:
22FDX® fMAX Optimization through Parasitics Reduction and GM Boost. ESSDERC 2019: 166-169 - [c3]Luca Pirro, Alban Zaka, Olaf Zimmerhackl, T. Hermann, Michael Otto, E. M. Bazizi, Jan Hoentschel, X. Li, R. Taylor:
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias. IRPS 2019: 1-5 - 2018
- [c2]Luca Pirro, Olaf Zimmerhackl, Alban Zaka, Lars Müller-Meskamp, Ranjith Nelluri, Tom Hermann, Ignasi Cortes-Mayol, Andreas Huschka, Michael Otto, E. Nowak, Anurag Mittal, Jan Hoentschel:
RTN and LFN Noise Performance in Advanced FDSOI Technology. ESSDERC 2018: 254-257
2000 – 2009
- 2009
- [c1]Manfred Horstmann, Andy Wei, Jan Hoentschel, Thomas Feudel, Thilo Scheiper, Rolf Stephan, Martin Gerhardt, Stephan Krügel, Michael Raab:
Advanced SOI CMOS transistor technologies for high-performance microprocessor applications. CICC 2009: 149-152
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