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Hakim Tahi
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2010 – 2019
- 2015
- [j4]S. M. Merah, Bécharia Nadji, Hakim Tahi
:
Low magnetic field Impact on NBTI degradation. Microelectron. Reliab. 55(9-10): 1460-1463 (2015) - 2014
- [j3]Cherifa Tahanout, Hakim Tahi
, Boualem Djezzar
, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Bécharia Nadji:
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction. J. Electron. Test. 30(4): 415-423 (2014) - [j2]Hakim Tahi
, Boualem Djezzar
, Abdelmadjid Benabdelmoumene
, Amel Chenouf
, Mohamed Goudjil:
Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique. Microelectron. Reliab. 54(5): 882-888 (2014) - [c4]Abdelmadjid Benabdelmoumene
, Boualem Djezzar
, Hakim Tahi, Amel Chenouf
, Mohamed Goudjil, Rafik Serhane
, Fayçal Hadj Larbi, Mohamed Kechouane
:
Does NBTI effect in MOS transistors depend on channel length? ICM 2014: 52-55 - [c3]Amel Chenouf
, Boualem Djezzar
, Abdelmadjid Benabdelmoumene, Hakim Tahi, Mohamed Goudjil:
Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses. IDT 2014: 142-146 - [c2]Mohamed Boubaaya, Hakim Tahi, Boualem Djezzar
, Karim Benmassai, Abdelmadjid Benabdelmoumene
, Mohamed Goudjil, Djamila Doumaz, Abdelhak Feraht Hemida:
Reaction-diffusion model for interface traps induced by BTS stress including H+, H and H2 as diffusion species. IDT 2014: 231-235 - [c1]Hakim Tahi, Boualem Djezzar
, Karim Benmassai, Mohamed Boubaaya, Abdelmadjid Benabdelmoumene
, Amel Chenouf
, Mohamed Goudjil:
Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction. IDT 2014: 236-241 - 2013
- [j1]Hakim Tahi
, Boualem Djezzar
, Abdelmadjid Benabdelmoumene
:
A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issues. Microelectron. Reliab. 53(4): 513-519 (2013)
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