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2020 – today
- 2024
[c6]Xinyu Pi, Mingyuan Wu, Jize Jiang, Haozhen Zheng, Beitong Tian, ChengXiang Zhai, Klara Nahrstedt, Zhiting Hu:
UOUO: Uncontextualized Uncommon Objects for Measuring Knowledge Horizons of Vision Language Models. EMNLP 2024: 6432-6441- [i3]Xinyu Pi, Mingyuan Wu, Jize Jiang, Haozhen Zheng, Beitong Tian, Chengxiang Zhai, Klara Nahrstedt, Zhiting Hu:
UOUO: Uncontextualized Uncommon Objects for Measuring Knowledge Horizons of Vision Language Models. CoRR abs/2407.18391 (2024) - 2023
- [i2]Adam Davies, Jize Jiang, ChengXiang Zhai:
Competence-Based Analysis of Language Models. CoRR abs/2303.00333 (2023) - [i1]Ziyi Chen, Heyi Tao, Daqian Zuo, Jize Jiang, Jun Yang, Yuxiang Wei:
Efficient Title Reranker for Fast and Improved Knowledge-Intense NLP. CoRR abs/2312.12430 (2023)
2010 – 2019
- 2018
- [j2]Jize Jiang
, Wei Shu, Joseph S. Chang:
A 65-nm CMOS Low Dropout Regulator Featuring >60-dB PSRR Over 10-MHz Frequency Range and 100-mA Load Current Range. IEEE J. Solid State Circuits 53(8): 2331-2342 (2018) - [c5]Wei Shu, Jize Jiang, Kwen-Siong Chong, Joseph Sylvester Chang:
Radiation Hardening By Design Integrated Circuits Enabling Low-Cost Satellites for Internet-of-Things. DSP 2018: 1-4 - 2017
- [j1]Jize Jiang, Wei Shu, Joseph S. Chang:
A 5.6 ppm/°C Temperature Coefficient, 87-dB PSRR, Sub-1-V Voltage Reference in 65-nm CMOS Exploiting the Zero-Temperature-Coefficient Point. IEEE J. Solid State Circuits 52(3): 623-633 (2017) - 2016
- [c4]Jize Jiang, Wei Shu, Kwen-Siong Chong, Tong Lin, Ne Kyaw Zwa Lwin, Joseph Sylvester Chang, Jingyuan Liu:
Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process. ISCAS 2016: 5-8 - [c3]Tong Lin, Kwen-Siong Chong, Wei Shu, Ne Kyaw Zwa Lwin, Jize Jiang, Joseph S. Chang:
Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process. ISCAS 2016: 966-969 - 2015
- [c2]Jize Jiang, Wei Shu, Joseph Sylvester Chang, Jingyuan Liu:
A novel subthreshold voltage reference featuring 17ppm/°C TC within -40°C to 125°C and 75dB PSRR. ISCAS 2015: 501-504 - 2014
- [c1]Joseph S. Chang, Kwen-Siong Chong, Wei Shu, Tong Lin, Jize Jiang, Ne Kyaw Zwa Lwin, Yang Kang:
Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process. MWSCAS 2014: 821-824
Coauthor Index
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