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ORCIDYongJoon Kim
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2010 – 2019
- 2016
[j10]Taehee Lee, YongJoon Kim, Joon-Sung Yang:
Temperature and voltage droop-aware test scheduling during scan shift operation. IEICE Electron. Express 13(18): 20160581 (2016)- 2010
- [j9]YongJoon Kim, Jaeseok Park, Sungho Kang:
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption. IEICE Trans. Inf. Syst. 93-D(1): 193-196 (2010) - [j8]YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective Scan Slice Grouping Technique for Efficient Test Data Compression. IEICE Trans. Inf. Syst. 93-D(2): 380-383 (2010)
2000 – 2009
- 2009
- [j7]YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. IEICE Electron. Express 6(20): 1432-1437 (2009) - [j6]YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang:
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. IEICE Trans. Inf. Syst. 92-D(7): 1462-1465 (2009) - [c7]Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang:
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS 2009: 152-157 - 2008
- [j5]Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electron. Test. 24(6): 591-595 (2008) - [c6]Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang:
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. ATS 2008: 83-88 - [c5]Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang:
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. ATS 2008: 151-156 - [c4]Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang:
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation. VTS 2008: 73-78 - 2007
- [j4]Sunghoon Chun, YongJoon Kim, Sungho Kang:
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. J. Electron. Test. 23(4): 357-362 (2007) - [c3]Sunghoon Chun, YongJoon Kim, Sungho Kang:
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects. ATS 2007: 115-120 - 2006
- [j3]Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 649-654 (2006) - [c2]YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang:
An Effective Test Pattern Generation for Testing Signal Integrity. ATS 2006: 279-286 - 2004
- [j2]YongJoon Kim, Hyun-Don Kim, Sungho Kang:
A new maximal diagnosis algorithm for interconnect test. IEEE Trans. Very Large Scale Integr. Syst. 12(5): 532-537 (2004) - 2003
- [j1]Hong-Sik Kim, YongJoon Kim, Sungho Kang:
Test-decompression mechanism using a variable-length multiple-polynomial LFSR. IEEE Trans. Very Large Scale Integr. Syst. 11(4): 687-690 (2003) - [c1]YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang:
A New Maximal Diagnosis Algorithm for Bus-structured Systems. ITC 2003: 349-357
Coauthor Index
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