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2010 – 2019
- 2019
[j4]Young-Ju Kim, Hye-Jung Kwon, Su-Yeon Doo, Min-Su Ahn, Yong-Hun Kim, Yong Jae Lee, Dong-Seok Kang, Sung-Geun Do, Chang-Yong Lee, Gun-hee Cho, Jae-Koo Park, Jae-Sung Kim, Kyung-Bae Park, Seung-Hoon Oh, Sang-Yong Lee, Ji-Hak Yu, Ki-Hun Yu, Chul-Hee Jeon, Sang-Sun Kim, Hyun-Soo Park, Jeong-Woo Lee, Seung-Hyun Cho, Keon-Woo Park, Yong-Jun Kim, Young-Hun Seo, Chang-Ho Shin, ChanYong Lee, Sam-Young Bang, Youn-Sik Park, Seouk-Kyu Choi, Byung-Cheol Kim, Gong-Heum Han, Seung-Jun Bae, Hyuk-Jun Kwon, Jung-Hwan Choi, Young-Soo Sohn, Kwang-Il Park, Seong-Jin Jang, Gyo-Young Jin:
A 16-Gb, 18-Gb/s/pin GDDR6 DRAM With Per-Bit Trainable Single-Ended DFE and PLL-Less Clocking. IEEE J. Solid State Circuits 54(1): 197-209 (2019)- 2017
- [j3]Kyomin Sohn
, Won-Joo Yun, Reum Oh, Chi-Sung Oh, Seong-Young Seo, Min-Sang Park, Dong-Hak Shin, Won-Chang Jung, Sang-Hoon Shin, Je-Min Ryu, Hye-Seung Yu, Jae-Hun Jung, Hyunui Lee, Seok-Yong Kang, Young-Soo Sohn, Jung-Hwan Choi, Yong-Cheol Bae, Seong-Jin Jang, Gyo-Young Jin:
A 1.2 V 20 nm 307 GB/s HBM DRAM With At-Speed Wafer-Level IO Test Scheme and Adaptive Refresh Considering Temperature Distribution. IEEE J. Solid State Circuits 52(1): 250-260 (2017) - [c9]Sang-uhn Cha, Seongil O, Hyunsung Shin, Sangjoon Hwang, Kwang-Il Park, Seong-Jin Jang, Joo-Sun Choi, Gyo-Young Jin, Young Hoon Son, Hyunyoon Cho, Jung Ho Ahn, Nam Sung Kim:
Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices. HPCA 2017: 61-72 - [c8]Chang-Kyo Lee, Yoon-Joo Eom, Jin-Hee Park, Junha Lee, Hye-Ran Kim, Kihan Kim, Young Choi, Ho-Jun Chang, Jonghyuk Kim, Jong-Min Bang, Seungjun Shin, Hanna Park, Su-Jin Park, Young-Ryeol Choi, Hoon Lee, Kyong-Ho Jeon, Jae-Young Lee, Hyo-Joo Ahn, Kyoung-Ho Kim, Jung-Sik Kim, Soobong Chang, Hyong-Ryol Hwang, Duyeul Kim, Yoon-Hwan Yoon, Seok-Hun Hyun, Joon-Young Park, Yoon-Gyu Song, Youn-Sik Park, Hyuck-Joon Kwon, Seung-Jun Bae, Tae-Young Oh, Indal Song, Yong-Cheol Bae, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang, Gyo-Young Jin:
23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme. ISSCC 2017: 390-391 - [c7]Hye-Jung Kwon, Eunsung Seo, ChangYong Lee, Young-Hun Seo, Gong-Heum Han, Hye-Ran Kim, Jong-Ho Lee, Min-Su Jang, Sung-Geun Do, Seung-Hyun Cho, Jae-Koo Park, Su-Yeon Doo, Jung-Bum Shin, Sang-Hoon Jung, Hyoung-Ju Kim, In-Ho Im, Beob-Rae Cho, Jaewoong Lee, Jae-Youl Lee, Ki-Hun Yu, Hyung-Kyu Kim, Chul-Hee Jeon, Hyun-Soo Park, Sang-Sun Kim, Seok-Ho Lee, Jong-Wook Park, Seung-Sub Lee, Bo-Tak Lim, Jun-Young Park, Yoon-Sik Park, Hyuk-Jun Kwon, Seung-Jun Bae, Jung-Hwan Choi, Kwang-Il Park, Seong-Jin Jang, Gyo-Young Jin:
23.4 An extremely low-standby-power 3.733Gb/s/pin 2Gb LPDDR4 SDRAM for wearable devices. ISSCC 2017: 394-395 - 2016
- [c6]Hyunui Lee, Sukyong Kang, Hye-Seung Yu, Won-Joo Yun, Jae-Hun Jung, Sungoh Ahn, Wang-Soo Kim, Beomyong Kil, Yoo-Chang Sung, Sang-Hoon Shin, Yong-Sik Park, Yong-Hwan Kim, Kyung-Woo Nam, Indal Song, Kyomin Sohn, Yong-Cheol Bae, Jung-Hwan Choi, Seong-Jin Jang, Gyo-Young Jin:
Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). A-SSCC 2016: 169-172 - [c5]Hye-Yoon Joo, Seung-Jun Bae, Young-Soo Sohn, Young-Sik Kim, Kyung-Soo Ha, Min-Su Ahn, Young-Ju Kim, Yong-Jun Kim, Ju-Hwan Kim, Won-Jun Choi, Chang-Ho Shin, Soo Hwan Kim, Byeong-Cheol Kim, Seung-Bum Ko, Kwang-Il Park, Seong-Jin Jang, Gyo-Young Jin:
18.1 A 20nm 9Gb/s/pin 8Gb GDDR5 DRAM with an NBTI monitor, jitter reduction techniques and improved power distribution. ISSCC 2016: 314-315 - [c4]Kyomin Sohn, Won-Joo Yun, Reum Oh, Chi-Sung Oh, Seong-Young Seo, Min-Sang Park, Dong-Hak Shin, Won-Chang Jung, Sang-Hoon Shin, Je-Min Ryu, Hye-Seung Yu, Jae-Hun Jung, Kyung-Woo Nam, Seouk-Kyu Choi, Jaewook Lee, Uksong Kang, Young-Soo Sohn, Jung-Hwan Choi, Chi-Wook Kim, Seong-Jin Jang, Gyo-Young Jin:
18.2 A 1.2V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution. ISSCC 2016: 316-317 - 2015
- [c3]Ki-Hyun Kim, Hyung-Shin Kwon, Hee-Il Hong, Hong-Sun Hwang, Kang-Yong Cho, Gyo-Young Jin:
The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data. IEEM 2015: 381-385 - [c2]Chang-Kyo Lee, Min-Su Ahn, Daesik Moon, Kiho Kim, Yoon-Joo Eom, Won-Young Lee, Jongmin Kim, Sanghyuk Yoon, Baekkyu Choi, Seokhong Kwon, Joon-Young Park, Seung-Jun Bae, Yong-Cheol Bae, Jung-Hwan Choi, Seong-Jin Jang, Gyo-Young Jin:
A 6.4Gb/s/pin at sub-1V supply voltage TX-interleaving technique for mobile DRAM interface. VLSIC 2015: 182- - 2012
- [c1]Youngseung Cho, Yoosang Hwang, Huijung Kim, Eunok Lee, Soojin Hong, Hyun-Woo Chung, Daeik Kim, Jinyoung Kim, Yong Chul Oh, Hyeongsun Hong, Gyo-Young Jin, Chilhee Chung:
Novel Deep Trench Buried-Body-Contact (DBBC) of 4F2 cell for sub 30nm DRAM technology. ESSDERC 2012: 193-196 - 2010
- [j2]Ki-Whan Song, Jinyoung Kim, Jae-Man Yoon, Sua Kim, Huijung Kim, Hyun-Woo Chung, Hyungi Kim, Kanguk Kim, Hwan-Wook Park, Hyun Chul Kang, Nam-Kyun Tak, Dukha Park, Woo-Seop Kim, Yeong-Taek Lee, Yong Chul Oh, Gyo-Young Jin, Jei-Hwan Yoo, Donggun Park, Kyungseok Oh, Changhyun Kim, Young-Hyun Jun:
A 31 ns Random Cycle VCAT-Based 4F 2 DRAM With Manufacturability and Enhanced Cell Efficiency. IEEE J. Solid State Circuits 45(4): 880-888 (2010)
1990 – 1999
- 1991
- [j1]Gyo-Young Jin, Young-June Park, Hong-Shick Min:
Mixed particle Monte Carlo method for deep submicron semiconductor device simulator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(12): 1534-1541 (1991)
Coauthor Index
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