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ORCIDTristan Dubois
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2020 – today
- 2020
[c3]L. Curos, Tristan Dubois, G. Mejecaze, F. Puybaret, Jean-Michel Vinassa:
Susceptibility Modelling of SMPS Input Stage Under High Current Pulse Injection. ICIT 2020: 511-516
2010 – 2019
- 2018
- [j7]M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp:
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectron. Reliab. 88-90: 914-919 (2018) - 2017
- [j6]S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois
, Jean-Yves Delétage, André Durier, Hélène Frémont:
Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectron. Reliab. 76-77: 674-679 (2017) - 2015
- [j5]Tristan Dubois, Siham Hairoud, Marcio Hermany Gomes de Oliveira, Hélène Frémont, Geneviève Duchamp:
Characterization and model of temperature effect on the conducted immunity of Op-Amp. Microelectron. Reliab. 55(9-10): 2055-2060 (2015) - [j4]Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55(9-10): 2067-2071 (2015) - [j3]Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64(9): 2496-2503 (2015) - 2013
- [c2]Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp:
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. EMC Compo 2013: 53-58 - 2011
- [c1]Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, Patrick Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jérémy Raoult, Philippe Calvel:
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. LATW 2011: 1-4 - 2010
- [j2]Sylvie Jarrix, Tristan Dubois, R. Adam, Philippe Nouvel, Bruno Azaïs, Daniel Gasquet:
Probe Characterization for Electromagnetic Near-Field Studies. IEEE Trans. Instrum. Meas. 59(2): 292-300 (2010)
2000 – 2009
- 2008
- [j1]Tristan Dubois, Sylvie Jarrix, Annick Penarier, Philippe Nouvel, Daniel Gasquet, Laurent Chusseau, Bruno Azaïs:
Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits. IEEE Trans. Instrum. Meas. 57(11): 2398-2404 (2008)
Coauthor Index
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