A 30-ns 64-Mb DRAM with built-in self-test and self-repair function - Akira Tanabe; Toshio Takeshima; Hiroki Koike; Yoshiharu Aimoto; Masahide Takada; Toshiyuki Ishijima; Naoki Kasai; Hiromitsu Hada; Kentaro Shibahara; Takemitsu Kunio; Takaho Tanigawa; Takanori Saeki; et al. (IEEE J. Solid State Circuits, 1992)

A Micro-Kernel Architecture for Next Generation Processor - Toshio Okamoto; Hiaeo Segawa; Sung Ho Shin; Hiroshi Nozue; Ken-ichi Maeda; Mitsuo Saito (Proceedings of the Workshop on Micro-kernels and Other Kernel Architectures, Seattle, WA, USA, 27-28 April 1992s, 1992)