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2020 – today
- 2024
[c9]Dipjyoti Das, Lance Fernandes, Prasanna Venkatesan Ravindran, Taeyoung Song
, Chinsung Park, Nashrah Afroze, Mengkun Tian, Hang Chen, Winston Chem, Kijoon Kim, Jongho Woo, Suhwan Lim, Kwangsoo Kim, Wanki Kim, Daewon Ha, Shimeng Yu, Suman Datta, Asif Islam Khan:
Design Framework for Ferroelectric Gate Stack Engineering of Vertical NAND Structures for Efficient TLC and QLC Operation. IMW 2024: 1-4- [c8]Taeyoung Kim, Suhwan Lim, Ilho Myeong, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Moonkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Ilyoung Yoon, Chaeho Kim, Kwanzsoo Kim, Kwanzmin Park, Bong Jin Kuh, Jinseong Heo, Wanki Kim, Daewon Ha, Jaihyuk Song:
Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET. IRPS 2024: 6 - [c7]Ilho Myeong, Suhwan Lim, Taeyoung Kim, Sanghyun Park, Suseong Noh, Seung Min Lee, Jongho Woo, Hanseung Ko, Youngji Noh, Munkang Choi, Kiheun Lee, Sangwoo Han, Jongyeon Baek, Kijoon Kim, Dongjin Jung, Jisung Kim, Jaewoo Park, Seunghyun Kim, Hyoseok Kim, Ilyounz Yoon, Jaeho Kim, Kwangsoo Kim, Kwangmin Park, Bong Jin Kuh, Wanki Kim, Daewon Ha, Sujin Ahn, Jaihyuk Song, Sijung Yoo, Hyun Jae Lee, Duk-Hyun Choe, Seung-Geol Nam, Jinseong Heo:
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND. IRPS 2024: 9 - [c6]Giuk Kim, Hyojun Choi, Hunbeom Shin, Sangho Lee, Sangmok Lee, Yunseok Nam, Minhyun Jung, Ilho Myeong, Kijoon Kim, Jongho Woo, Suhwan Lim, Kwangsoo Kim, Wanki Kim, Daewon Ha, Jinho Ahn, Sanghun Jeon:
In-depth Analysis of the Hafnia Ferroelectrics as a Key Enabler for Low Voltage & QLC 3D VNAND Beyond 1K Layers: Experimental Demonstration and Modeling. VLSI Technology and Circuits 2024: 1-2 - [i1]Zijian Zhao, Sola Woo, Khandker Akif Aabrar, Sharadindu Gopal Kirtania, Zhouhang Jiang, Shan Deng, Yi Xiao, Halid Mulaosmanovic, Stefan Dünkel, Dominik Kleimaier, Steven Soss, Sven Beyer, Rajiv V. Joshi, Scott Meninger, Mohamed Mohamed, Kijoon Kim, Jongho Woo, Suhwan Lim, Kwangsoo Kim, Wanki Kim, Daewon Ha, Vijaykrishnan Narayanan, Suman Datta, Shimeng Yu, Kai Ni:
Paving the Way for Pass Disturb Free Vertical NAND Storage via A Dedicated and String-Compatible Pass Gate. CoRR abs/2403.04981 (2024) - 2022
- [j4]Jin-Ping Han, Malte J. Rasch, Zuoguang Liu, Paul Solomon, Kevin Brew, Kangguo Cheng, Injo Ok, Victor Chan, Michael Longstreet, Wanki Kim, Robert L. Bruce, Cheng-Wei Cheng, Nicole Saulnier, Vijay Narayanan:
Impact of Phase-Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large-Scale Deep Learning Networks. Adv. Intell. Syst. 4(5) (2022) - [j3]Uicheol Shin, Masatoshi Ishii, Atsuya Okazaki, Megumi Ito, Malte J. Rasch, Wanki Kim, Akiyo Nomura, Wonseok Choi, Dooyong Koh, Kohji Hosokawa, Matthew BrightSky, Seiji Munetoh, SangBum Kim:
Pattern Training, Inference, and Regeneration Demonstration Using On-Chip Trainable Neuromorphic Chips for Spiking Restricted Boltzmann Machine. Adv. Intell. Syst. 4(8) (2022) - 2021
- [c5]Robert L. Bruce, Syed Ghazi Sarwat, Irem Boybat, Cheng-Wei Cheng, Wanki Kim, S. R. Nandakumar, Charles Mackin, Timothy Philip, Zuoguang Liu, Kevin Brew, Nanbo Gong, Injo Ok, Praneet Adusumilli, Katie Spoon, Stefano Ambrogio, Benedikt Kersting, Thomas Bohnstingl, Manuel Le Gallo, Andrew Simon, Ning Li, Iqbal Saraf, Jin-Ping Han, Lynne M. Gignac, John M. Papalia, Tenko Yamashita, Nicole Saulnier, Geoffrey W. Burr, Hsinyu Tsai, Abu Sebastian, Vijay Narayanan, Matthew BrightSky:
Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation. IRPS 2021: 1-6
2010 – 2019
- 2019
- [c4]Masatoshi Ishii, Megumi Ito, Wanki Kim, SangBum Kim, Akiyo Nomura, Atsuya Okazaki, Junka Okazawa, Kohji Hosokawa, Matthew BrightSky, Wilfried Haensch:
Performance Analysis of Spiking RBM with Measurement-Based Phase Change Memory Model. ICONIP (5) 2019: 591-599 - [c3]Eduard A. Cartier, Wanki Kim, Nanbo Gong, Tayfun Gokmen, Martin M. Frank, Douglas M. Bishop, Youngseok Kim, Seyoung Kim, Takashi Ando, Ernest Y. Wu, Praneet Adusumilli, John Rozen, Paul M. Solomon, Wilfried Haensch, Matthew J. BrightSky, Abu Sebastian, Geoffrey W. Burr, Vijay Narayanan:
Reliability Challenges with Materials for Analog Computing. IRPS 2019: 1-10 - 2018
- [j2]Sangjae Lee, Byong Seon Kim, Youngmin Kim, Wanki Kim, Wonbin Ahn:
The framework for factors affecting technology transfer for suppliers and buyers of technology in Korea. Technol. Anal. Strateg. Manag. 30(2): 172-185 (2018) - [c2]Wanki Kim, SangBum Kim, Robert L. Bruce, Fabio Carta, G. Fraczak, A. Ray, Chung Lam, Matthew BrightSky, Yu Zhu, T. Masuda, K. Suu, Yujun Xie, Yerin Kim, Judy J. Cha:
Reliability benefits of a metallic liner in confined PCM. IRPS 2018: 6 - 2012
- [j1]Sangjae Lee, Wanki Kim, Young Min Kim, Kyong Joo Oh:
Using AHP to determine intangible priority factors for technology transfer adoption. Expert Syst. Appl. 39(7): 6388-6395 (2012) - [c1]Young Yang Liauw, Zhiping Zhang, Wanki Kim, Abbas El Gamal, S. Simon Wong:
Nonvolatile 3D-FPGA with monolithically stacked RRAM-based configuration memory. ISSCC 2012: 406-408
Coauthor Index
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