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2020 – today
- 2022
[c14]Bekir Zahit Demiray, Baris Arslan:
Test Cost-Test Quality Modeling For Adaptive Test. AQTR 2022: 1-5
2010 – 2019
- 2016
- [j2]Baris Arslan, Alex Orailoglu:
Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(1): 141-154 (2016) - [j1]Baris Arslan, Alex Orailoglu:
Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(12): 2093-2103 (2016) - [c13]Baris Arslan:
Small delay defect diagnosis through failure observation ordering. AQTR 2016: 1-6 - 2013
- [b1]Baris Arslan:
Adaptive Test Cost and Quality Optimization Through An Effective Yet Efficient Delivery of Chip Specific Tests. University of California, San Diego, USA, 2013 - [c12]Baris Arslan, Alex Orailoglu:
Full exploitation of process variation space for continuous delivery of optimal delay test quality. ASP-DAC 2013: 552-557 - [c11]Baris Arslan, Alex Orailoglu:
Tracing the best test mix through multi-variate quality tracking. VTS 2013: 1-6 - 2012
- [c10]Baris Arslan, Alex Orailoglu:
Delay test resource allocation and scheduling for multiple frequency domains. VTS 2012: 114-119 - 2011
- [c9]Baris Arslan, Alex Orailoglu:
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost. Asian Test Symposium 2011: 323-328 - [c8]Baris Arslan, Alex Orailoglu:
Adaptive test optimization through real time learning of test effectiveness. DATE 2011: 1430-1435 - 2010
- [c7]Baris Arslan, Alex Orailoglu:
Delay test quality maximization through process-aware selection of test set size. ICCD 2010: 390-395
2000 – 2009
- 2004
- [c6]Baris Arslan, Alex Orailoglu:
CircularScan: A Scan Architecture for Test Cost Reduction. DATE 2004: 1290-1295 - [c5]Baris Arslan, Alex Orailoglu:
Design space exploration for aggressive test cost reduction in CircularScan architectures. ICCAD 2004: 726-731 - [c4]Baris Arslan, Ozgur Sinanoglu, Alex Orailoglu:
Extending the Applicability of Parallel-Serial Scan Designs. ICCD 2004: 200-203 - [c3]Baris Arslan, Alex Orailoglu:
Test Cost Reduction Through A Reconfigurable Scan Architecture. ITC 2004: 945-952 - 2003
- [c2]Baris Arslan, Alex Orailoglu:
Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information. Asian Test Symposium 2003: 230-235 - 2002
- [c1]Baris Arslan, Alex Orailoglu:
Fault Dictionary Size Reduction through Test Response Superposition. ICCD 2002: 480-
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